J. Schardt
J. Schardt publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, on topics such as Silicon Carbide Semiconductor Technologies, Semiconductor materials and devices and Copper Interconnects and Reliability.
- World rank
- #1,890,513 of 7,710,434 ranked researchers
- Rank in Germany
- #93,315 of 364,343
- Works
- 25
- Citations
- 1.1k
- Citations per work
- 43.7
What does J. Schardt research?
J. Schardt's work is mostly in Engineering (37%), Materials Science (27%), Physics and Astronomy (19%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2182.7%
- Engineering937.3%
- Materials Science726.7%
- Physics and Astronomy518.7%
- Everything else414.6%
- Life Sciences12.7%
- 1Electrical and Electronic Engineering37% of their works
- 2Atomic and Molecular Physics, and Optics19% of their works
- 3Electronic, Optical and Magnetic Materials12% of their works
- 4Ceramics and Composites8% of their works
- 5Materials Chemistry7% of their works
- 6Structural Biology3% of their works
Research topics
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Copper Interconnects and Reliability
- Semiconductor materials and interfaces
- Advanced ceramic materials synthesis
- Surface and Thin Film Phenomena
- Graphene research and applications
- Advanced Electron Microscopy Techniques and Applications
Which keywords describe J. Schardt's research?
The keywords of their largest research topics: Reliability, Wide Bandgap Semiconductors, Thin Films, Atomic Layer Deposition, High-k Dielectrics, Low-k Dielectrics, Microelectronics and Metal-Semiconductor Contacts.
- Cryo-Electron Microscopy
- Graphene
- Quantum Size Effects
- Ceramic Materials
- Metal-Semiconductor Contacts
- Low-k Dielectrics
- Atomic Layer Deposition
- Wide Bandgap Semiconductors
- Reliability
- Thin Films
- High-k Dielectrics
- Microelectronics
- Schottky Barrier
- Sintering
- Superconductivity
- Two-Dimensional Materials
- Single-Particle Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Reliability171 topic
- Wide Bandgap Semiconductors171 topic
- Thin Films142 topics
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Low-k Dielectrics91 topic
- Microelectronics91 topic
- Metal-Semiconductor Contacts71 topic
- Schottky Barrier71 topic
- Ceramic Materials61 topic
- Sintering61 topic
- Quantum Size Effects51 topic
- Superconductivity51 topic
- Graphene31 topic
- Two-Dimensional Materials31 topic
- Cryo-Electron Microscopy21 topic
- Single-Particle Analysis21 topic
Where does J. Schardt work?
J. Schardt's main affiliation in the publication record is Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany.
How many publications and citations does J. Schardt have?
OpenAlex counts 25 works and 1,092 citations for J. Schardt, an h-index of 18, ranking #1,890,513 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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