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Researcher · KLA (United States) · United States

James N. Wiley

James N. Wiley publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Industrial Vision Systems and Defect Detection and Integrated Circuits and Semiconductor Failure Analysis.

OpenAlex
World rank
#7,317,925
of 7,710,434 ranked researchers
Rank in United States
#1,600,378
of 1,627,098
Works
26
Citations
73
Citations per work
2.8
h-index
5
i10-index 2Top 89% in Electrical and Electronic Engineering
James N. Wiley

What does James N. Wiley research?

James N. Wiley's work is mostly in Engineering (85%), Materials Science (13%).

Physical Sciences: 26 works · 98.6% of their workEngineering: 22 works · 85.4% of their workElectrical and Electronic Engineering: 13 works · 51.3% of their workIndustrial and Manufacturing Engineering: 6 works · 23.7% of their workBiomedical Engineering: 1 works · 3.9% of their workComputational Mechanics: 1 works · 3.9% of their workMechanical Engineering: 1 works · 2.6% of their workMaterials Science: 3 works · 13.2% of their workSurfaces, Coatings and Films: 3 works · 13.2% of their workTHEIR WORKJames N. Wiley26works
Physical Sciences99%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering2285.4%
    2. Materials Science313.2%
  1. 1Electrical and Electronic Engineering51% of their works
  2. 2Industrial and Manufacturing Engineering24% of their works
  3. 3Surfaces, Coatings and Films13% of their works
  4. 4Computational Mechanics4% of their works
  5. 5Biomedical Engineering4% of their works
  6. 6Mechanical Engineering3% of their works

Research topics

Which keywords describe James N. Wiley's research?

The keywords of their largest research topics: High-Resolution Patterning, Electron Beam Lithography, Nanofabrication, Machine Vision, Fabric Defect Detection, Texture Analysis, Failure Analysis and Integrated Circuits.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 18 words, with their numbers
  1. High-Resolution Patterning272 topics
  2. Electron Beam Lithography261 topic
  3. Nanofabrication261 topic
  4. Machine Vision212 topics
  5. Fabric Defect Detection181 topic
  6. Texture Analysis181 topic
  7. Failure Analysis111 topic
  8. Integrated Circuits111 topic
  9. Scanning Electron Microscopy101 topic
  10. X-ray Photoelectron Spectroscopy101 topic
  11. Roughness Measurement31 topic
  12. Surface Characterization31 topic
  13. Chemical Mechanical Planarization21 topic
  14. Material Removal Mechanism21 topic
  15. Residual Stress21 topic
  16. Welding21 topic
  17. Nanolithography11 topic
  18. Soft Lithography11 topic

Where does James N. Wiley work?

James N. Wiley's main affiliation in the publication record is KLA (United States), United States.

How many publications and citations does James N. Wiley have?

OpenAlex counts 26 works and 73 citations for James N. Wiley, an h-index of 5, ranking #7,317,925 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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