Jan Mulkens
Jan Mulkens publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Advanced Surface Polishing Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #6,913,124 of 7,710,434 ranked researchers
- Rank in Netherlands
- #104,197 of 107,149
- Works
- 50
- Citations
- 642
- Citations per work
- 12.8
What does Jan Mulkens research?
Jan Mulkens's work is mostly in Engineering (82%), Materials Science (11%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4793.7%
- Engineering4182.5%
- Materials Science611.2%
- Everything else36.3%
- 1Electrical and Electronic Engineering52% of their works
- 2Biomedical Engineering20% of their works
- 3Surfaces, Coatings and Films11% of their works
- 4Mechanical Engineering5% of their works
- 5Computational Mechanics4% of their works
- 6Industrial and Manufacturing Engineering2% of their works
Research topics
- Advancements in Photolithography Techniques
- Advanced Surface Polishing Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Optical Coatings and Gratings
- 3D IC and TSV technologies
- Nanofabrication and Lithography Techniques
- Advanced Measurement and Metrology Techniques
- Surface Roughness and Optical Measurements
Which keywords describe Jan Mulkens's research?
The keywords of their largest research topics: Nanofabrication, High-Resolution Patterning, Electron Beam Lithography, Resolution Limits, Chemical Mechanical Planarization, Material Removal Mechanism, Failure Analysis and Integrated Circuits.
- Surface Characterization
- Soft Lithography
- Error Compensation
- Through-Silicon Via
- Nanostructures
- Integrated Circuits
- Material Removal Mechanism
- Resolution Limits
- High-Resolution Patterning
- Nanofabrication
- Electron Beam Lithography
- Chemical Mechanical Planarization
- Failure Analysis
- Antireflective Coatings
- Interconnect
- Dimensional Metrology
- Nanolithography
- Roughness Measurement
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Nanofabrication602 topics
- High-Resolution Patterning532 topics
- Electron Beam Lithography471 topic
- Resolution Limits471 topic
- Chemical Mechanical Planarization201 topic
- Material Removal Mechanism201 topic
- Failure Analysis151 topic
- Integrated Circuits151 topic
- Antireflective Coatings131 topic
- Nanostructures131 topic
- Interconnect71 topic
- Through-Silicon Via71 topic
- Dimensional Metrology61 topic
- Error Compensation61 topic
- Nanolithography61 topic
- Soft Lithography61 topic
- Roughness Measurement51 topic
- Surface Characterization51 topic
Where does Jan Mulkens work?
Jan Mulkens's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Jan Mulkens have?
OpenAlex counts 50 works and 642 citations for Jan Mulkens, an h-index of 15, ranking #6,913,124 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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