Joong Jung Kim
Joong Jung Kim publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Structural Biology, on topics such as Advanced Electron Microscopy Techniques and Applications, Semiconductor materials and devices and Force Microscopy Techniques and Applications.
- World rank
- #7,498,475 of 7,710,434 ranked researchers
- Rank in South Korea
- #155,870 of 162,609
- Works
- 42
- Citations
- 278
- Citations per work
- 6.6
What does Joong Jung Kim research?
Joong Jung Kim's work is mostly in Engineering (38%), Physics and Astronomy (18%), Materials Science (16%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3071.8%
- Engineering1637.9%
- Physics and Astronomy717.7%
- Materials Science716.2%
- Everything else818.5%
- Life Sciences49.7%
- 1Electrical and Electronic Engineering30% of their works
- 2Atomic and Molecular Physics, and Optics18% of their works
- 3Structural Biology10% of their works
- 4Electronic, Optical and Magnetic Materials10% of their works
- 5Biomedical Engineering8% of their works
- 6Surfaces, Coatings and Films6% of their works
Research topics
- Advanced Electron Microscopy Techniques and Applications
- Semiconductor materials and devices
- Force Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Copper Interconnects and Reliability
- Silicon and Solar Cell Technologies
Which keywords describe Joong Jung Kim's research?
The keywords of their largest research topics: Cryo-Electron Microscopy, Single-Particle Analysis, Atomic Force Microscopy, Atomic Layer Deposition, Force Spectroscopy, High-k Dielectrics, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.
- Solar Cells
- Microelectronics
- Low-k Dielectrics
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- High-k Dielectrics
- Atomic Layer Deposition
- Single-Particle Analysis
- Cryo-Electron Microscopy
- Atomic Force Microscopy
- Force Spectroscopy
- Scanning Electron Microscopy
- Failure Analysis
- Chemical Mechanical Planarization
- Material Removal Mechanism
- Silicon
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Cryo-Electron Microscopy121 topic
- Single-Particle Analysis121 topic
- Atomic Force Microscopy91 topic
- Atomic Layer Deposition91 topic
- Force Spectroscopy91 topic
- High-k Dielectrics91 topic
- Scanning Electron Microscopy81 topic
- X-ray Photoelectron Spectroscopy81 topic
- Failure Analysis71 topic
- Integrated Circuits71 topic
- Chemical Mechanical Planarization51 topic
- Low-k Dielectrics51 topic
- Material Removal Mechanism51 topic
- Microelectronics51 topic
- Silicon41 topic
- Solar Cells41 topic
Where does Joong Jung Kim work?
Joong Jung Kim's main affiliation in the publication record is Samsung (South Korea), South Korea.
How many publications and citations does Joong Jung Kim have?
OpenAlex counts 42 works and 278 citations for Joong Jung Kim, an h-index of 11, ranking #7,498,475 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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