Kris Dickson
Kris Dickson publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Hardware and Architecture, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Electron and X-Ray Spectroscopy Techniques and VLSI and Analog Circuit Testing.
- World rank
- #6,630,675 of 7,710,434 ranked researchers
- Rank in Germany
- #331,855 of 364,343
- Works
- 15
- Citations
- 72
- Citations per work
- 4.8
What does Kris Dickson research?
Kris Dickson's work is mostly in Engineering (61%), Materials Science (12%), Computer Science (9%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1388.4%
- Engineering960.5%
- Materials Science211.6%
- Computer Science19.3%
- Physics and Astronomy17.0%
- Everything else211.6%
- 1Electrical and Electronic Engineering46% of their works
- 2Surfaces, Coatings and Films12% of their works
- 3Hardware and Architecture9% of their works
- 4Biomedical Engineering7% of their works
- 5Atomic and Molecular Physics, and Optics7% of their works
- 6Industrial and Manufacturing Engineering7% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- VLSI and Analog Circuit Testing
- Advanced Surface Polishing Techniques
- Industrial Vision Systems and Defect Detection
- Ion-surface interactions and analysis
- Semiconductor materials and devices
- Electrostatic Discharge in Electronics
Which keywords describe Kris Dickson's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Embedded Cores, Test Data Compression, Chemical Mechanical Planarization and Fabric Defect Detection.
- Surface Analysis
- High-k Dielectrics
- CMOS Technology
- Material Removal Mechanism
- Fabric Defect Detection
- Test Data Compression
- X-ray Photoelectron Spectroscopy
- Integrated Circuits
- Failure Analysis
- Scanning Electron Microscopy
- Embedded Cores
- Chemical Mechanical Planarization
- Machine Vision
- Atomic Layer Deposition
- ESD Protection
- Ion Beam
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Embedded Cores41 topic
- Test Data Compression41 topic
- Chemical Mechanical Planarization31 topic
- Fabric Defect Detection31 topic
- Machine Vision31 topic
- Material Removal Mechanism31 topic
- Atomic Layer Deposition21 topic
- CMOS Technology21 topic
- ESD Protection21 topic
- High-k Dielectrics21 topic
- Ion Beam21 topic
- Surface Analysis21 topic
Where does Kris Dickson work?
Kris Dickson's main affiliation in the publication record is NXP (Germany), Germany.
How many publications and citations does Kris Dickson have?
OpenAlex counts 15 works and 72 citations for Kris Dickson, an h-index of 4, ranking #6,630,675 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
Ask a question or share a note about Kris Dickson. Keep it to the research: no personal attacks, advertising or links. Any reader can report a post, which collapses it for everyone until it is opened.