M. Buzzo
M. Buzzo publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Structural Biology, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Silicon Carbide Semiconductor Technologies and Silicon and Solar Cell Technologies.
- World rank
- #6,543,847 of 7,710,434 ranked researchers
- Rank in Austria
- #39,144 of 43,330
- Works
- 17
- Citations
- 97
- Citations per work
- 5.7
What does M. Buzzo research?
M. Buzzo's work is mostly in Engineering (71%), Materials Science (10%), Biochemistry, Genetics and Molecular Biology (6%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1484.3%
- Engineering1270.6%
- Materials Science29.8%
- Physics and Astronomy13.9%
- Everything else17.8%
- Life Sciences15.9%
- Social Sciences02.0%
- 1Electrical and Electronic Engineering71% of their works
- 2Surfaces, Coatings and Films8% of their works
- 3Structural Biology6% of their works
- 4Atomic and Molecular Physics, and Optics4% of their works
- 5Management Information Systems2% of their works
- 6Materials Chemistry2% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Silicon and Solar Cell Technologies
- Semiconductor materials and devices
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advancements in Semiconductor Devices and Circuit Design
- Thin-Film Transistor Technologies
Which keywords describe M. Buzzo's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Solar Cells, Reliability, Wide Bandgap Semiconductors, Efficiency, Silicon and Atomic Layer Deposition.
- Thin-Film Transistors
- Nanowire Transistors
- Cryo-Electron Microscopy
- Scanning Electron Microscopy
- Atomic Layer Deposition
- Efficiency
- Reliability
- Integrated Circuits
- Failure Analysis
- Solar Cells
- Wide Bandgap Semiconductors
- Silicon
- High-k Dielectrics
- X-ray Photoelectron Spectroscopy
- Single-Particle Analysis
- Plasmonics
- Tunnel Field-Effect Transistors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Failure Analysis121 topic
- Integrated Circuits121 topic
- Solar Cells82 topics
- Reliability71 topic
- Wide Bandgap Semiconductors71 topic
- Efficiency61 topic
- Silicon61 topic
- Atomic Layer Deposition51 topic
- High-k Dielectrics51 topic
- Scanning Electron Microscopy41 topic
- X-ray Photoelectron Spectroscopy41 topic
- Cryo-Electron Microscopy31 topic
- Single-Particle Analysis31 topic
- Nanowire Transistors21 topic
- Plasmonics21 topic
- Thin-Film Transistors21 topic
- Tunnel Field-Effect Transistors21 topic
Where does M. Buzzo work?
M. Buzzo's main affiliation in the publication record is Infineon Technologies (Austria), Austria.
How many publications and citations does M. Buzzo have?
OpenAlex counts 17 works and 97 citations for M. Buzzo, an h-index of 5, ranking #6,543,847 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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