Niklas Dellby
Niklas Dellby publishes mostly in Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, on topics such as Advanced Electron Microscopy Techniques and Applications, Electron and X-Ray Spectroscopy Techniques and Advanced X-ray Imaging Techniques.
- World rank
- #1,027,515 of 7,710,434 ranked researchers
- Rank in United States
- #334,604 of 1,627,098
- Works
- 150
- Citations
- 9.2k
- Citations per work
- 61.5
What does Niklas Dellby research?
Niklas Dellby's work is mostly in Materials Science (32%), Biochemistry, Genetics and Molecular Biology (27%), Physics and Astronomy (16%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences8556.4%
- Materials Science4832.3%
- Physics and Astronomy2315.5%
- Engineering138.6%
- Life Sciences4027.0%
- Everything else2516.6%
- 1Structural Biology27% of their works
- 2Surfaces, Coatings and Films25% of their works
- 3Electrical and Electronic Engineering9% of their works
- 4Atomic and Molecular Physics, and Optics8% of their works
- 5Materials Chemistry7% of their works
- 6Radiation7% of their works
Research topics
- Advanced Electron Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Advanced X-ray Imaging Techniques
- Force Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Ion-surface interactions and analysis
- Electronic and Structural Properties of Oxides
Which keywords describe Niklas Dellby's research?
The keywords of their largest research topics: Cryo-Electron Microscopy, Single-Particle Analysis, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Phase Retrieval, X-ray Imaging, Atomic Force Microscopy and Force Spectroscopy.
- Two-Dimensional Electron Gases
- Oxide Interfaces
- Integrated Circuits
- Three-Dimensional Analysis
- Force Spectroscopy
- X-ray Imaging
- X-ray Photoelectron Spectroscopy
- Single-Particle Analysis
- Cryo-Electron Microscopy
- Scanning Electron Microscopy
- Phase Retrieval
- Atomic Force Microscopy
- Atom Probe Tomography
- Failure Analysis
- Ion Beam
- Surface Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Cryo-Electron Microscopy1131 topic
- Single-Particle Analysis1131 topic
- Scanning Electron Microscopy1031 topic
- X-ray Photoelectron Spectroscopy1031 topic
- Phase Retrieval261 topic
- X-ray Imaging261 topic
- Atomic Force Microscopy191 topic
- Force Spectroscopy191 topic
- Atom Probe Tomography181 topic
- Three-Dimensional Analysis181 topic
- Failure Analysis151 topic
- Integrated Circuits151 topic
- Ion Beam101 topic
- Oxide Interfaces101 topic
- Surface Analysis101 topic
- Two-Dimensional Electron Gases101 topic
Where does Niklas Dellby work?
Niklas Dellby's main affiliation in the publication record is Nion (United States), United States.
How many publications and citations does Niklas Dellby have?
OpenAlex counts 150 works and 9,218 citations for Niklas Dellby, an h-index of 31, ranking #1,027,515 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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