Noel S. Smith
Noel S. Smith publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films, on topics such as Ion-surface interactions and analysis, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #4,531,709 of 7,710,434 ranked researchers
- Rank in United States
- #1,203,844 of 1,627,098
- Works
- 20
- Citations
- 390
- Citations per work
- 19.5
What does Noel S. Smith research?
Noel S. Smith's work is mostly in Engineering (64%), Materials Science (14%), Biochemistry, Genetics and Molecular Biology (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1678.0%
- Engineering1364.4%
- Materials Science313.6%
- Everything else418.6%
- Life Sciences13.4%
- 1Electrical and Electronic Engineering29% of their works
- 2Computational Mechanics20% of their works
- 3Surfaces, Coatings and Films14% of their works
- 4Biomedical Engineering8% of their works
- 5Mechanics of Materials7% of their works
- 6Structural Biology3% of their works
Research topics
- Ion-surface interactions and analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Metal and Thin Film Mechanics
- Advanced Materials Characterization Techniques
- Plasma Diagnostics and Applications
- Advanced Electron Microscopy Techniques and Applications
- Advanced biosensing and bioanalysis techniques
Which keywords describe Noel S. Smith's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Ion Beam, Surface Analysis, X-ray Photoelectron Spectroscopy, Electron Inelastic Mean Free Paths, Scanning Electron Microscopy and Nanoindentation.
- DNA nanotechnology
- Cryo-Electron Microscopy
- Semiconductor Industry
- Atom Probe Tomography
- Nanoindentation
- Electron Inelastic Mean Free Paths
- Surface Analysis
- Integrated Circuits
- Failure Analysis
- Ion Beam
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Thin Films
- Plasma Etching
- Three-Dimensional Analysis
- Single-Particle Analysis
- Self-Assembly
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Failure Analysis121 topic
- Integrated Circuits121 topic
- Ion Beam121 topic
- Surface Analysis121 topic
- X-ray Photoelectron Spectroscopy122 topics
- Electron Inelastic Mean Free Paths81 topic
- Scanning Electron Microscopy81 topic
- Nanoindentation41 topic
- Thin Films41 topic
- Atom Probe Tomography31 topic
- Plasma Etching31 topic
- Semiconductor Industry31 topic
- Three-Dimensional Analysis31 topic
- Cryo-Electron Microscopy21 topic
- Single-Particle Analysis21 topic
- DNA nanotechnology11 topic
- Self-Assembly11 topic
Where does Noel S. Smith work?
Noel S. Smith's main affiliation in the publication record is Oregon Physics (United States), United States.
How many publications and citations does Noel S. Smith have?
OpenAlex counts 20 works and 390 citations for Noel S. Smith, an h-index of 9, ranking #4,531,709 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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