Ondrej L. Krivanek
Ondrej L. Krivanek publishes mostly in Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering, on topics such as Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #562,059 of 7,710,434 ranked researchers
- Rank in United States
- #193,876 of 1,627,098
- Works
- 221
- Citations
- 12k
- Citations per work
- 54.5
What does Ondrej L. Krivanek research?
Ondrej L. Krivanek's work is mostly in Materials Science (33%), Biochemistry, Genetics and Molecular Biology (23%), Physics and Astronomy (15%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences13661.5%
- Materials Science7232.8%
- Physics and Astronomy3415.4%
- Engineering2913.3%
- Life Sciences5122.9%
- Everything else3415.6%
- 1Surfaces, Coatings and Films24% of their works
- 2Structural Biology23% of their works
- 3Electrical and Electronic Engineering13% of their works
- 4Materials Chemistry8% of their works
- 5Radiation8% of their works
- 6Atomic and Molecular Physics, and Optics8% of their works
Research topics
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced X-ray Imaging Techniques
- Force Microscopy Techniques and Applications
- X-ray Spectroscopy and Fluorescence Analysis
- Electronic and Structural Properties of Oxides
- Semiconductor materials and devices
Which keywords describe Ondrej L. Krivanek's research?
The keywords of their largest research topics: Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Cryo-Electron Microscopy, Single-Particle Analysis, Failure Analysis, Integrated Circuits, Phase Retrieval and X-ray Imaging.
- High-k Dielectrics
- Two-Dimensional Electron Gases
- X-ray Absorption
- Force Spectroscopy
- X-ray Imaging
- Integrated Circuits
- Single-Particle Analysis
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Cryo-Electron Microscopy
- Failure Analysis
- Phase Retrieval
- Atomic Force Microscopy
- Spectroscopy
- Oxide Interfaces
- Atomic Layer Deposition
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Scanning Electron Microscopy1501 topic
- X-ray Photoelectron Spectroscopy1501 topic
- Cryo-Electron Microscopy1411 topic
- Single-Particle Analysis1411 topic
- Failure Analysis331 topic
- Integrated Circuits331 topic
- Phase Retrieval271 topic
- X-ray Imaging271 topic
- Atomic Force Microscopy221 topic
- Force Spectroscopy221 topic
- Spectroscopy171 topic
- X-ray Absorption171 topic
- Oxide Interfaces161 topic
- Two-Dimensional Electron Gases161 topic
- Atomic Layer Deposition151 topic
- High-k Dielectrics151 topic
Where does Ondrej L. Krivanek work?
Ondrej L. Krivanek's main affiliation in the publication record is Nion (United States), United States.
How many publications and citations does Ondrej L. Krivanek have?
OpenAlex counts 221 works and 12,043 citations for Ondrej L. Krivanek, an h-index of 46, ranking #562,059 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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