Orion Mouraille
Orion Mouraille publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Advanced Surface Polishing Techniques.
- World rank
- #6,024,446 of 7,710,434 ranked researchers
- Rank in Netherlands
- #98,699 of 107,149
- Works
- 26
- Citations
- 176
- Citations per work
- 6.8
What does Orion Mouraille research?
Orion Mouraille's work is mostly in Engineering (83%), Materials Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2491.0%
- Engineering2283.3%
- Materials Science27.7%
- Everything else29.0%
- 1Electrical and Electronic Engineering59% of their works
- 2Biomedical Engineering9% of their works
- 3Surfaces, Coatings and Films8% of their works
- 4Industrial and Manufacturing Engineering6% of their works
- 5Civil and Structural Engineering5% of their works
- 6Computational Mechanics4% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Electron and X-Ray Spectroscopy Techniques
- Industrial Vision Systems and Defect Detection
- Granular flow and fluidized beds
- 3D IC and TSV technologies
- Geotechnical Engineering and Underground Structures
Which keywords describe Orion Mouraille's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Chemical Mechanical Planarization, Material Removal Mechanism, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.
- Tunnel
- Through-Silicon Via
- Granular Flows
- Machine Vision
- X-ray Photoelectron Spectroscopy
- Material Removal Mechanism
- Integrated Circuits
- Nanofabrication
- Electron Beam Lithography
- Failure Analysis
- Chemical Mechanical Planarization
- Scanning Electron Microscopy
- Fabric Defect Detection
- Discrete Particle Simulation
- Interconnect
- Seismic
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Electron Beam Lithography231 topic
- Nanofabrication231 topic
- Failure Analysis141 topic
- Integrated Circuits141 topic
- Chemical Mechanical Planarization61 topic
- Material Removal Mechanism61 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Fabric Defect Detection41 topic
- Machine Vision41 topic
- Discrete Particle Simulation31 topic
- Granular Flows31 topic
- Interconnect31 topic
- Through-Silicon Via31 topic
- Seismic21 topic
- Tunnel21 topic
Where does Orion Mouraille work?
Orion Mouraille's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Orion Mouraille have?
OpenAlex counts 26 works and 176 citations for Orion Mouraille, an h-index of 6, ranking #6,024,446 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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