Peter D. Brooker
Peter D. Brooker publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,345,086 of 7,710,434 ranked researchers
- Rank in United States
- #1,602,351 of 1,627,098
- Works
- 27
- Citations
- 73
- Citations per work
- 2.7
What does Peter D. Brooker research?
Peter D. Brooker's work is mostly in Engineering (76%), Materials Science (18%), Physics and Astronomy (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2695.0%
- Engineering2176.0%
- Materials Science517.7%
- Physics and Astronomy01.3%
- Everything else15.0%
- 1Electrical and Electronic Engineering54% of their works
- 2Surfaces, Coatings and Films18% of their works
- 3Biomedical Engineering9% of their works
- 4Mechanical Engineering8% of their works
- 5Industrial and Manufacturing Engineering5% of their works
- 6Atomic and Molecular Physics, and Optics1% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Welding Techniques and Residual Stresses
- Industrial Vision Systems and Defect Detection
- Photonic and Optical Devices
- 3D IC and TSV technologies
Which keywords describe Peter D. Brooker's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Integrated Circuits, Failure Analysis, Photon Emission Microscopy and Chemical Mechanical Planarization.
- Silicon Photonics
- Interconnect
- Fabric Defect Detection
- Residual Stress
- Chemical Mechanical Planarization
- Failure Analysis
- X-ray Photoelectron Spectroscopy
- Nanofabrication
- Electron Beam Lithography
- Scanning Electron Microscopy
- Integrated Circuits
- Photon Emission Microscopy
- Material Removal Mechanism
- Welding
- Machine Vision
- Optical Modulators
- Through-Silicon Via
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Electron Beam Lithography251 topic
- Nanofabrication251 topic
- Scanning Electron Microscopy131 topic
- X-ray Photoelectron Spectroscopy131 topic
- Integrated Circuits112 topics
- Failure Analysis91 topic
- Photon Emission Microscopy91 topic
- Chemical Mechanical Planarization61 topic
- Material Removal Mechanism61 topic
- Residual Stress41 topic
- Welding41 topic
- Fabric Defect Detection31 topic
- Machine Vision31 topic
- Interconnect21 topic
- Optical Modulators21 topic
- Silicon Photonics21 topic
- Through-Silicon Via21 topic
Where does Peter D. Brooker work?
Peter D. Brooker's main affiliation in the publication record is Synopsys (United States), United States.
How many publications and citations does Peter D. Brooker have?
OpenAlex counts 27 works and 73 citations for Peter D. Brooker, an h-index of 5, ranking #7,345,086 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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