Qi-De Qian
Qi-De Qian publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Industrial Vision Systems and Defect Detection and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,206,174 of 7,710,434 ranked researchers
- Rank in United States
- #1,591,896 of 1,627,098
- Works
- 24
- Citations
- 74
- Citations per work
- 3.1
What does Qi-De Qian research?
Qi-De Qian's work is mostly in Engineering (78%), Materials Science (9%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2186.9%
- Engineering1978.2%
- Materials Science28.7%
- Everything else313.1%
- 1Electrical and Electronic Engineering44% of their works
- 2Industrial and Manufacturing Engineering12% of their works
- 3Biomedical Engineering10% of their works
- 4Surfaces, Coatings and Films9% of their works
- 5Mechanical Engineering7% of their works
- 6Computational Mechanics6% of their works
Research topics
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Advanced Surface Polishing Techniques
- Optical measurement and interference techniques
- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
Which keywords describe Qi-De Qian's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Machine Vision, Fabric Defect Detection, Texture Analysis, Failure Analysis, Integrated Circuits and Scanning Electron Microscopy.
- Structured Light
- Error Compensation
- Camera Calibration
- Chemical Mechanical Planarization
- Scanning Electron Microscopy
- Failure Analysis
- Fabric Defect Detection
- Nanofabrication
- Electron Beam Lithography
- Machine Vision
- Texture Analysis
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Material Removal Mechanism
- Dimensional Metrology
- Roughness Measurement
- Surface Characterization
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Electron Beam Lithography201 topic
- Nanofabrication201 topic
- Machine Vision102 topics
- Fabric Defect Detection71 topic
- Texture Analysis71 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Chemical Mechanical Planarization41 topic
- Material Removal Mechanism41 topic
- Camera Calibration31 topic
- Dimensional Metrology31 topic
- Error Compensation31 topic
- Roughness Measurement31 topic
- Structured Light31 topic
- Surface Characterization31 topic
Where does Qi-De Qian work?
Qi-De Qian's main affiliation in the publication record is Intel (United States), United States.
How many publications and citations does Qi-De Qian have?
OpenAlex counts 24 works and 74 citations for Qi-De Qian, an h-index of 5, ranking #7,206,174 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
Ask a question or share a note about Qi-De Qian. Posts are plain text and can be reported.