S. Eichenberger
S. Eichenberger publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Semiconductor materials and devices.
- World rank
- #1,618,483 of 7,710,434 ranked researchers
- Rank in Netherlands
- #36,126 of 107,149
- Works
- 28
- Citations
- 736
- Citations per work
- 26.3
What does S. Eichenberger research?
S. Eichenberger's work is mostly in Engineering (71%), Computer Science (26%), Energy (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences28100.0%
- Engineering2071.1%
- Computer Science726.5%
- Energy01.2%
- Materials Science01.2%
- 1Electrical and Electronic Engineering66% of their works
- 2Hardware and Architecture26% of their works
- 3Industrial and Manufacturing Engineering4% of their works
- 4Control and Systems Engineering1% of their works
- 5Nuclear Energy and Engineering1% of their works
- 6Materials Chemistry1% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Industrial Vision Systems and Defect Detection
- Physical Unclonable Functions (PUFs) and Hardware Security
Which keywords describe S. Eichenberger's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, Atomic Layer Deposition, High-k Dielectrics, Electron Beam Lithography and Nanofabrication.
- Physical Unclonable Functions
- Machine Vision
- ESD Protection
- Tunnel Field-Effect Transistors
- Nanofabrication
- High-k Dielectrics
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Atomic Layer Deposition
- Electron Beam Lithography
- Nanowire Transistors
- CMOS Technology
- Fabric Defect Detection
- Hardware Trojans
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Failure Analysis261 topic
- Integrated Circuits261 topic
- Embedded Cores211 topic
- Test Data Compression211 topic
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Electron Beam Lithography71 topic
- Nanofabrication71 topic
- Nanowire Transistors61 topic
- Tunnel Field-Effect Transistors61 topic
- CMOS Technology21 topic
- ESD Protection21 topic
- Fabric Defect Detection21 topic
- Machine Vision21 topic
- Hardware Trojans11 topic
- Physical Unclonable Functions11 topic
Where does S. Eichenberger work?
S. Eichenberger's main affiliation in the publication record is NXP (Netherlands), Netherlands.
How many publications and citations does S. Eichenberger have?
OpenAlex counts 28 works and 736 citations for S. Eichenberger, an h-index of 12, ranking #1,618,483 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Other researchers named S. Eichenberger
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
Ask a question or share a note about S. Eichenberger. Posts are plain text and can be reported.