S. Yegnasubramanian
S. Yegnasubramanian publishes mostly in Electrical and Electronic Engineering, Radiation and Materials Chemistry, on topics such as Nuclear Physics and Applications, Integrated Circuits and Semiconductor Failure Analysis and Ion-surface interactions and analysis.
- World rank
- #7,183,451 of 7,710,434 ranked researchers
- Rank in United States
- #1,590,085 of 1,627,098
- Works
- 22
- Citations
- 76
- Citations per work
- 3.5
What does S. Yegnasubramanian research?
S. Yegnasubramanian's work is mostly in Engineering (39%), Materials Science (19%), Physics and Astronomy (17%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1775.1%
- Engineering939.2%
- Materials Science418.7%
- Physics and Astronomy417.2%
- Everything else524.9%
- 1Electrical and Electronic Engineering27% of their works
- 2Radiation17% of their works
- 3Materials Chemistry11% of their works
- 4Surfaces, Coatings and Films8% of their works
- 5Mechanics of Materials6% of their works
- 6Computational Mechanics6% of their works
Research topics
- Nuclear Physics and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Ion-surface interactions and analysis
- Electron and X-Ray Spectroscopy Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- VLSI and Analog Circuit Testing
Which keywords describe S. Yegnasubramanian's research?
The keywords of their largest research topics: Neutron Imaging, Small-Angle Scattering, Failure Analysis, Integrated Circuits, Ion Beam, Scanning Electron Microscopy, Spectroscopy and Surface Analysis.
- Test Data Compression
- Lead-free Solders
- High-k Dielectrics
- X-ray Photoelectron Spectroscopy
- Surface Analysis
- Scanning Electron Microscopy
- Integrated Circuits
- Small-Angle Scattering
- Neutron Imaging
- Failure Analysis
- Ion Beam
- Spectroscopy
- X-ray Absorption
- Atomic Layer Deposition
- Interfacial Reactions
- Embedded Cores
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Neutron Imaging71 topic
- Small-Angle Scattering71 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Ion Beam41 topic
- Scanning Electron Microscopy41 topic
- Spectroscopy41 topic
- Surface Analysis41 topic
- X-ray Absorption41 topic
- X-ray Photoelectron Spectroscopy41 topic
- Atomic Layer Deposition31 topic
- High-k Dielectrics31 topic
- Interfacial Reactions31 topic
- Lead-free Solders31 topic
- Embedded Cores21 topic
- Test Data Compression21 topic
Where does S. Yegnasubramanian work?
S. Yegnasubramanian's main affiliation in the publication record is AT&T (United States), United States.
How many publications and citations does S. Yegnasubramanian have?
OpenAlex counts 22 works and 76 citations for S. Yegnasubramanian, an h-index of 5, ranking #7,183,451 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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