Timon F. Fliervoet
Timon F. Fliervoet publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Geophysics, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #3,001,173 of 7,710,434 ranked researchers
- Rank in Netherlands
- #61,425 of 107,149
- Works
- 33
- Citations
- 806
- Citations per work
- 24.4
What does Timon F. Fliervoet research?
Timon F. Fliervoet's work is mostly in Engineering (42%), Materials Science (22%), Earth and Planetary Sciences (18%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2781.3%
- Engineering1441.7%
- Materials Science721.9%
- Earth and Planetary Sciences617.7%
- Everything else515.6%
- Life Sciences13.1%
- 1Electrical and Electronic Engineering36% of their works
- 2Surfaces, Coatings and Films19% of their works
- 3Geophysics18% of their works
- 4Biomedical Engineering5% of their works
- 5Structural Biology3% of their works
- 6Materials Chemistry3% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Geological and Geochemical Analysis
- earthquake and tectonic studies
- High-pressure geophysics and materials
- Optical Coatings and Gratings
- Advanced Electron Microscopy Techniques and Applications
Which keywords describe Timon F. Fliervoet's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis, Integrated Circuits and Plate Tectonics.
- Single-Particle Analysis
- Nanostructures
- Crystal Structure Prediction
- Subduction
- Zircon
- Plate Tectonics
- Failure Analysis
- Scanning Electron Microscopy
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- X-ray Photoelectron Spectroscopy
- Integrated Circuits
- Geochronology
- Earthquakes
- Antireflective Coatings
- Mantle Dynamics
- Cryo-Electron Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Nanofabrication252 topics
- Electron Beam Lithography211 topic
- Resolution Limits211 topic
- Scanning Electron Microscopy141 topic
- X-ray Photoelectron Spectroscopy141 topic
- Failure Analysis111 topic
- Integrated Circuits111 topic
- Plate Tectonics102 topics
- Geochronology61 topic
- Zircon61 topic
- Earthquakes51 topic
- Subduction51 topic
- Antireflective Coatings41 topic
- Crystal Structure Prediction41 topic
- Mantle Dynamics41 topic
- Nanostructures41 topic
- Cryo-Electron Microscopy31 topic
- Single-Particle Analysis31 topic
Where does Timon F. Fliervoet work?
Timon F. Fliervoet's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Timon F. Fliervoet have?
OpenAlex counts 33 works and 806 citations for Timon F. Fliervoet, an h-index of 14, ranking #3,001,173 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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