Tom Mountsier
Tom Mountsier publishes mostly in Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Mechanics of Materials, on topics such as Copper Interconnects and Reliability, Semiconductor materials and devices and Electronic Packaging and Soldering Technologies.
- World rank
- #5,429,066 of 7,710,434 ranked researchers
- Rank in United States
- #1,374,579 of 1,627,098
- Works
- 24
- Citations
- 355
- Citations per work
- 14.8
What does Tom Mountsier research?
Tom Mountsier's work is mostly in Engineering (64%), Materials Science (22%), Physics and Astronomy (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2293.0%
- Engineering1563.9%
- Materials Science522.2%
- Physics and Astronomy26.9%
- Everything else27.0%
- 1Electrical and Electronic Engineering47% of their works
- 2Electronic, Optical and Magnetic Materials22% of their works
- 3Mechanics of Materials8% of their works
- 4Atomic and Molecular Physics, and Optics7% of their works
- 5Biomedical Engineering6% of their works
- 6Computational Mechanics3% of their works
Research topics
- Copper Interconnects and Reliability
- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- Metal and Thin Film Mechanics
- Semiconductor materials and interfaces
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- 3D IC and TSV technologies
Which keywords describe Tom Mountsier's research?
The keywords of their largest research topics: Electromigration, Thin Films, Low-k Dielectrics, Microelectronics, Atomic Layer Deposition, High-k Dielectrics, Interfacial Reactions and Lead-free Solders.
- Through-Silicon Via
- Interconnect
- Integrated Circuits
- Schottky Barrier
- Nanoindentation
- Lead-free Solders
- High-k Dielectrics
- Microelectronics
- Thin Films
- Electromigration
- Low-k Dielectrics
- Atomic Layer Deposition
- Interfacial Reactions
- Coatings
- Metal-Semiconductor Contacts
- Failure Analysis
- Chemical Mechanical Planarization
- Material Removal Mechanism
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Electromigration232 topics
- Thin Films222 topics
- Low-k Dielectrics161 topic
- Microelectronics161 topic
- Atomic Layer Deposition141 topic
- High-k Dielectrics141 topic
- Interfacial Reactions71 topic
- Lead-free Solders71 topic
- Coatings61 topic
- Nanoindentation61 topic
- Metal-Semiconductor Contacts51 topic
- Schottky Barrier51 topic
- Failure Analysis41 topic
- Integrated Circuits41 topic
- Chemical Mechanical Planarization31 topic
- Interconnect31 topic
- Material Removal Mechanism31 topic
- Through-Silicon Via31 topic
Where does Tom Mountsier work?
Tom Mountsier's main affiliation in the publication record is Micro Focus (United States), United States.
How many publications and citations does Tom Mountsier have?
OpenAlex counts 24 works and 355 citations for Tom Mountsier, an h-index of 9, ranking #5,429,066 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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