Toshiya Ogiwara
Toshiya Ogiwara publishes mostly in Surfaces, Coatings and Films, Electrical and Electronic Engineering and Computational Mechanics, on topics such as Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,544,874 of 7,710,434 ranked researchers
- Rank in Japan
- #363,234 of 383,136
- Works
- 50
- Citations
- 96
- Citations per work
- 1.9
What does Toshiya Ogiwara research?
Toshiya Ogiwara's work is mostly in Engineering (41%), Materials Science (28%), Physics and Astronomy (10%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4079.5%
- Engineering2141.1%
- Materials Science1428.1%
- Physics and Astronomy510.3%
- Everything else1020.5%
- 1Surfaces, Coatings and Films23% of their works
- 2Electrical and Electronic Engineering22% of their works
- 3Computational Mechanics11% of their works
- 4Radiation10% of their works
- 5Biomedical Engineering8% of their works
- 6Materials Chemistry6% of their works
Research topics
- Electron and X-Ray Spectroscopy Techniques
- Ion-surface interactions and analysis
- Integrated Circuits and Semiconductor Failure Analysis
- X-ray Spectroscopy and Fluorescence Analysis
- Semiconductor materials and devices
- Advanced Materials Characterization Techniques
- Advancements in Photolithography Techniques
- Advanced Electron Microscopy Techniques and Applications
Which keywords describe Toshiya Ogiwara's research?
The keywords of their largest research topics: Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Quantitative Analysis, Ion Beam, Surface Analysis, Failure Analysis, Integrated Circuits and Spectroscopy.
- Cryo-Electron Microscopy
- Electron Beam Lithography
- Atom Probe Tomography
- Atomic Layer Deposition
- Spectroscopy
- Failure Analysis
- Ion Beam
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Quantitative Analysis
- Surface Analysis
- Integrated Circuits
- X-ray Absorption
- High-k Dielectrics
- Three-Dimensional Analysis
- Nanofabrication
- Single-Particle Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Scanning Electron Microscopy301 topic
- X-ray Photoelectron Spectroscopy301 topic
- Quantitative Analysis202 topics
- Ion Beam151 topic
- Surface Analysis151 topic
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Spectroscopy111 topic
- X-ray Absorption111 topic
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Atom Probe Tomography91 topic
- Three-Dimensional Analysis91 topic
- Electron Beam Lithography61 topic
- Nanofabrication61 topic
- Cryo-Electron Microscopy41 topic
- Single-Particle Analysis41 topic
Where does Toshiya Ogiwara work?
Toshiya Ogiwara's main affiliation in the publication record is National Institute for Materials Science, Japan.
How many publications and citations does Toshiya Ogiwara have?
OpenAlex counts 50 works and 96 citations for Toshiya Ogiwara, an h-index of 6, ranking #7,544,874 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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