Werner H. Gries
Werner H. Gries publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Radiation, on topics such as Ion-surface interactions and analysis, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #4,613,321 of 7,710,434 ranked researchers
- Rank in Germany
- #235,152 of 364,343
- Works
- 81
- Citations
- 813
- Citations per work
- 10.0
What does Werner H. Gries research?
Werner H. Gries's work is mostly in Engineering (35%), Materials Science (15%), Physics and Astronomy (15%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences5770.0%
- Engineering2935.3%
- Materials Science1215.2%
- Physics and Astronomy1215.2%
- Chemistry34.3%
- Everything else2430.0%
- 1Electrical and Electronic Engineering18% of their works
- 2Computational Mechanics17% of their works
- 3Radiation15% of their works
- 4Surfaces, Coatings and Films12% of their works
- 5Analytical Chemistry4% of their works
- 6Materials Chemistry3% of their works
Research topics
- Ion-surface interactions and analysis
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- X-ray Spectroscopy and Fluorescence Analysis
- Nuclear Physics and Applications
- Analytical chemistry methods development
- Semiconductor materials and devices
- Advancements in Photolithography Techniques
Which keywords describe Werner H. Gries's research?
The keywords of their largest research topics: Ion Beam, Surface Analysis, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis, Integrated Circuits, Spectroscopy and X-ray Absorption.
- Nanofabrication
- Electron Beam Lithography
- Solid-Phase Microextraction
- Small-Angle Scattering
- X-ray Absorption
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Surface Analysis
- Ion Beam
- Scanning Electron Microscopy
- Failure Analysis
- Spectroscopy
- Neutron Imaging
- Molecularly Imprinted Polymers
- Atomic Layer Deposition
- High-k Dielectrics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Ion Beam311 topic
- Surface Analysis311 topic
- Scanning Electron Microscopy231 topic
- X-ray Photoelectron Spectroscopy231 topic
- Failure Analysis161 topic
- Integrated Circuits161 topic
- Spectroscopy141 topic
- X-ray Absorption141 topic
- Neutron Imaging121 topic
- Small-Angle Scattering121 topic
- Molecularly Imprinted Polymers81 topic
- Solid-Phase Microextraction81 topic
- Atomic Layer Deposition61 topic
- Electron Beam Lithography61 topic
- High-k Dielectrics61 topic
- Nanofabrication61 topic
Where does Werner H. Gries work?
Werner H. Gries's main affiliation in the publication record is Deutsche Bundespost, Germany.
How many publications and citations does Werner H. Gries have?
OpenAlex counts 81 works and 813 citations for Werner H. Gries, an h-index of 13, ranking #4,613,321 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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