Xavier Gagnard
Xavier Gagnard publishes mostly in Electrical and Electronic Engineering, Materials Chemistry and Industrial and Manufacturing Engineering, on topics such as Semiconductor materials and devices, Thin-Film Transistor Technologies and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #4,088,207 of 7,710,434 ranked researchers
- Rank in France
- #172,041 of 324,115
- Works
- 20
- Citations
- 344
- Citations per work
- 17.2
What does Xavier Gagnard research?
Xavier Gagnard's work is mostly in Engineering (75%), Materials Science (10%), Computer Science (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1891.5%
- Engineering1574.9%
- Materials Science210.0%
- Computer Science13.3%
- Physics and Astronomy13.3%
- Everything else28.5%
- 1Electrical and Electronic Engineering68% of their works
- 2Materials Chemistry10% of their works
- 3Industrial and Manufacturing Engineering3% of their works
- 4Condensed Matter Physics3% of their works
- 5Biomedical Engineering3% of their works
- 6Hardware and Architecture3% of their works
Research topics
- Semiconductor materials and devices
- Thin-Film Transistor Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- 3D IC and TSV technologies
- Advancements in Semiconductor Devices and Circuit Design
- CCD and CMOS Imaging Sensors
- Silicon Nanostructures and Photoluminescence
- VLSI and Analog Circuit Testing
Which keywords describe Xavier Gagnard's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Failure Analysis, Integrated Circuits, Plasmonics, Thin-Film Transistors, Interconnect and Through-Silicon Via.
- Test Data Compression
- Tunnel Field-Effect Transistors
- Nanowire Transistors
- High-Speed Imaging
- Through-Silicon Via
- Thin-Film Transistors
- Integrated Circuits
- High-k Dielectrics
- Atomic Layer Deposition
- Failure Analysis
- Plasmonics
- Interconnect
- CMOS Image Sensors
- Nanoparticles
- Porous Silicon
- Embedded Cores
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Atomic Layer Deposition61 topic
- High-k Dielectrics61 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Plasmonics51 topic
- Thin-Film Transistors51 topic
- Interconnect41 topic
- Through-Silicon Via41 topic
- CMOS Image Sensors31 topic
- High-Speed Imaging31 topic
- Nanoparticles31 topic
- Nanowire Transistors31 topic
- Porous Silicon31 topic
- Tunnel Field-Effect Transistors31 topic
- Embedded Cores21 topic
- Test Data Compression21 topic
Where does Xavier Gagnard work?
Xavier Gagnard's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does Xavier Gagnard have?
OpenAlex counts 20 works and 344 citations for Xavier Gagnard, an h-index of 7, ranking #4,088,207 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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