Yair Eran
Yair Eran publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Industrial Vision Systems and Defect Detection and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,345,086 of 7,710,434 ranked researchers
- Rank in Israel
- #37,684 of 38,292
- Works
- 27
- Citations
- 14
- Citations per work
- 0.5
What does Yair Eran research?
Yair Eran's work is mostly in Engineering (86%), Materials Science (10%), Computer Science (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2798.9%
- Engineering2386.5%
- Materials Science39.9%
- Computer Science12.5%
- 1Electrical and Electronic Engineering51% of their works
- 2Industrial and Manufacturing Engineering27% of their works
- 3Surfaces, Coatings and Films10% of their works
- 4Computational Mechanics6% of their works
- 5Mechanical Engineering2% of their works
- 6Hardware and Architecture2% of their works
Research topics
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Surface Roughness and Optical Measurements
- VLSI and Analog Circuit Testing
- Manufacturing Process and Optimization
- Welding Techniques and Residual Stresses
Which keywords describe Yair Eran's research?
The keywords of their largest research topics: Electron Beam Lithography, Machine Vision, Nanofabrication, Fabric Defect Detection, Texture Analysis, Failure Analysis, Integrated Circuits and Scanning Electron Microscopy.
- Test Data Compression
- Embedded Cores
- Assembly Planning
- Roughness Measurement
- Scanning Electron Microscopy
- Failure Analysis
- Fabric Defect Detection
- Machine Vision
- Electron Beam Lithography
- Nanofabrication
- Texture Analysis
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Surface Characterization
- Design for Manufacture
- Residual Stress
- Welding
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Electron Beam Lithography251 topic
- Machine Vision252 topics
- Nanofabrication251 topic
- Fabric Defect Detection201 topic
- Texture Analysis201 topic
- Failure Analysis141 topic
- Integrated Circuits141 topic
- Scanning Electron Microscopy81 topic
- X-ray Photoelectron Spectroscopy81 topic
- Roughness Measurement51 topic
- Surface Characterization51 topic
- Assembly Planning21 topic
- Design for Manufacture21 topic
- Embedded Cores21 topic
- Residual Stress21 topic
- Test Data Compression21 topic
- Welding21 topic
Where does Yair Eran work?
Yair Eran's main affiliation in the publication record is Applied Materials (Israel), Israel.
How many publications and citations does Yair Eran have?
OpenAlex counts 27 works and 14 citations for Yair Eran, an h-index of 2, ranking #7,345,086 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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