Yiorgos Makris
Yiorgos Makris publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Artificial Intelligence, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Radiation Effects in Electronics.
- World rank
- #118,436 of 1,633,909 ranked researchers
- Rank in United States
- #50,940 of 358,040
- Works
- 76
- Citations
- 445
- Citations per work
- 5.9
What does Yiorgos Makris research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering38% of their works
- 2Hardware and Architecture30% of their works
- 3Artificial Intelligence10% of their works
- 4Cellular and Molecular Neuroscience6% of their works
- 5Industrial and Manufacturing Engineering5% of their works
- 6Computer Vision and Pattern Recognition2% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Physical Unclonable Functions (PUFs) and Hardware Security
- Neuroscience and Neural Engineering
- Low-power high-performance VLSI design
- Security and Verification in Computing
- Industrial Vision Systems and Defect Detection
Which keywords describe Yiorgos Makris's research?
The keywords of their largest research topics: CMOS Technology, Embedded Cores, Test Data Compression, Failure Analysis, Integrated Circuits, Radiation Effects, Soft Errors and Hardware Trojans.
- Security Policies
- Fabric Defect Detection
- Low-Power
- Electrode Arrays
- Hardware Trojans
- Radiation Effects
- Failure Analysis
- Embedded Cores
- CMOS Technology
- Test Data Compression
- Integrated Circuits
- Soft Errors
- Physical Unclonable Functions
- Neural Stimulation
- VLSI Circuits
- Machine Vision
- Side-Channel Attacks
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- CMOS Technology192 topics
- Embedded Cores191 topic
- Test Data Compression191 topic
- Failure Analysis141 topic
- Integrated Circuits141 topic
- Radiation Effects131 topic
- Soft Errors131 topic
- Hardware Trojans121 topic
- Physical Unclonable Functions121 topic
- Electrode Arrays71 topic
- Neural Stimulation71 topic
- Low-Power61 topic
- VLSI Circuits61 topic
- Fabric Defect Detection51 topic
- Machine Vision51 topic
- Security Policies51 topic
- Side-Channel Attacks51 topic
Where does Yiorgos Makris work?
Yiorgos Makris's main affiliation in the publication record is The University of Texas at Dallas, United States.
How many publications and citations does Yiorgos Makris have?
Science Explorer counts 76 works and 445 citations for Yiorgos Makris, ranking #118,436 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.