Youri van Dommelen
Youri van Dommelen publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Advanced Surface Polishing Techniques.
- World rank
- #6,191,271 of 7,710,434 ranked researchers
- Rank in Netherlands
- #99,984 of 107,149
- Works
- 26
- Citations
- 212
- Citations per work
- 8.2
What does Youri van Dommelen research?
Youri van Dommelen's work is mostly in Engineering (82%), Materials Science (9%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2490.7%
- Engineering2181.5%
- Materials Science29.2%
- Everything else29.3%
- 1Electrical and Electronic Engineering55% of their works
- 2Biomedical Engineering18% of their works
- 3Surfaces, Coatings and Films9% of their works
- 4Mechanical Engineering3% of their works
- 5Industrial and Manufacturing Engineering3% of their works
- 6Media Technology3% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Advanced optical system design
- 3D IC and TSV technologies
- Electron and X-Ray Spectroscopy Techniques
- Surface Roughness and Optical Measurements
- Semiconductor materials and devices
Which keywords describe Youri van Dommelen's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Chemical Mechanical Planarization, Material Removal Mechanism, Compound Eyes and Freeform Optics.
- Surface Characterization
- High-k Dielectrics
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Freeform Optics
- Material Removal Mechanism
- Integrated Circuits
- Nanofabrication
- Electron Beam Lithography
- Failure Analysis
- Chemical Mechanical Planarization
- Compound Eyes
- Interconnect
- Through-Silicon Via
- Atomic Layer Deposition
- Roughness Measurement
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Electron Beam Lithography231 topic
- Nanofabrication231 topic
- Failure Analysis101 topic
- Integrated Circuits101 topic
- Chemical Mechanical Planarization81 topic
- Material Removal Mechanism81 topic
- Compound Eyes51 topic
- Freeform Optics51 topic
- Interconnect51 topic
- Scanning Electron Microscopy51 topic
- Through-Silicon Via51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Atomic Layer Deposition21 topic
- High-k Dielectrics21 topic
- Roughness Measurement21 topic
- Surface Characterization21 topic
Where does Youri van Dommelen work?
Youri van Dommelen's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Youri van Dommelen have?
OpenAlex counts 26 works and 212 citations for Youri van Dommelen, an h-index of 9, ranking #6,191,271 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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