Bruce Cory
Bruce Cory publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Semiconductor materials and devices.
- World rank
- #4,509,102 of 7,710,434 ranked researchers
- Rank in United States
- #1,199,156 of 1,627,098
- Works
- 19
- Citations
- 223
- Citations per work
- 11.7
What does Bruce Cory research?
Bruce Cory's work is mostly in Engineering (68%), Computer Science (23%), Materials Science (6%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1896.2%
- Engineering1367.9%
- Computer Science422.6%
- Materials Science15.7%
- Everything else13.8%
- 1Electrical and Electronic Engineering49% of their works
- 2Hardware and Architecture23% of their works
- 3Industrial and Manufacturing Engineering8% of their works
- 4Biomedical Engineering8% of their works
- 5Surfaces, Coatings and Films6% of their works
- 6Control and Systems Engineering4% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Semiconductor materials and devices
- Industrial Vision Systems and Defect Detection
- Electron and X-Ray Spectroscopy Techniques
- Advanced Surface Polishing Techniques
- Near-Field Optical Microscopy
- Engineering and Test Systems
Which keywords describe Bruce Cory's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, Atomic Layer Deposition, Fabric Defect Detection, High-k Dielectrics and Machine Vision.
- Sequential Testing Algorithms
- Near-Field Optical Microscopy
- Fault Diagnosis
- X-ray Photoelectron Spectroscopy
- Machine Vision
- Fabric Defect Detection
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Atomic Layer Deposition
- High-k Dielectrics
- Scanning Electron Microscopy
- Chemical Mechanical Planarization
- Material Removal Mechanism
- Photonic Nanojets
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Failure Analysis171 topic
- Integrated Circuits171 topic
- Embedded Cores111 topic
- Test Data Compression111 topic
- Atomic Layer Deposition31 topic
- Fabric Defect Detection31 topic
- High-k Dielectrics31 topic
- Machine Vision31 topic
- Scanning Electron Microscopy31 topic
- X-ray Photoelectron Spectroscopy31 topic
- Chemical Mechanical Planarization21 topic
- Fault Diagnosis21 topic
- Material Removal Mechanism21 topic
- Near-Field Optical Microscopy21 topic
- Photonic Nanojets21 topic
- Sequential Testing Algorithms21 topic
Where does Bruce Cory work?
Bruce Cory's main affiliation in the publication record is Nvidia (United States), United States.
How many publications and citations does Bruce Cory have?
OpenAlex counts 19 works and 223 citations for Bruce Cory, an h-index of 7, ranking #4,509,102 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
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