C. T. Tsai
C. T. Tsai publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,438,344 of 7,710,434 ranked researchers
- Rank in Taiwan
- #55,843 of 57,035
- Works
- 53
- Citations
- 261
- Citations per work
- 4.9
What does C. T. Tsai research?
C. T. Tsai's work is mostly in Engineering (95%), Physics and Astronomy (3%), Materials Science (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences53100.0%
- Engineering5095.0%
- Physics and Astronomy23.1%
- Materials Science11.3%
- Computer Science00.6%
- 1Electrical and Electronic Engineering93% of their works
- 2Atomic and Molecular Physics, and Optics3% of their works
- 3Biomedical Engineering2% of their works
- 4Materials Chemistry1% of their works
- 5Hardware and Architecture1% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Electrostatic Discharge in Electronics
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and interfaces
- Low-power high-performance VLSI design
Which keywords describe C. T. Tsai's research?
The keywords of their largest research topics: Process Variation, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Failure Analysis, Integrated Circuits and Solar Cells.
- Low-Power
- Schottky Barrier
- Metal-Semiconductor Contacts
- ESD Protection
- Efficiency
- Solar Cells
- Failure Analysis
- Nanowire Transistors
- Atomic Layer Deposition
- Process Variation
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Integrated Circuits
- CMOS Technology
- Silicon
- SCR Devices
- Reliability
- Wide Bandgap Semiconductors
- VLSI Circuits
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 19 words, with their numbers
- Process Variation512 topics
- Atomic Layer Deposition481 topic
- High-k Dielectrics481 topic
- Nanowire Transistors471 topic
- Tunnel Field-Effect Transistors471 topic
- Failure Analysis161 topic
- Integrated Circuits161 topic
- Solar Cells132 topics
- CMOS Technology112 topics
- Efficiency81 topic
- Silicon81 topic
- ESD Protection71 topic
- SCR Devices71 topic
- Metal-Semiconductor Contacts51 topic
- Reliability51 topic
- Schottky Barrier51 topic
- Wide Bandgap Semiconductors51 topic
- Low-Power41 topic
- VLSI Circuits41 topic
Where does C. T. Tsai work?
C. T. Tsai's main affiliation in the publication record is United Microelectronics (Taiwan), Taiwan.
How many publications and citations does C. T. Tsai have?
OpenAlex counts 53 works and 261 citations for C. T. Tsai, an h-index of 10, ranking #7,438,344 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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