Chester S. Knurek
Chester S. Knurek publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,288,876 of 7,710,434 ranked researchers
- Rank in United States
- #1,598,224 of 1,627,098
- Works
- 25
- Citations
- 153
- Citations per work
- 6.1
What does Chester S. Knurek research?
Chester S. Knurek's work is mostly in Engineering (59%), Materials Science (28%), Physics and Astronomy (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2393.4%
- Engineering1558.7%
- Materials Science728.0%
- Physics and Astronomy14.0%
- Chemistry12.7%
- Everything else15.3%
- Life Sciences01.3%
- 1Electrical and Electronic Engineering51% of their works
- 2Surfaces, Coatings and Films28% of their works
- 3Biomedical Engineering8% of their works
- 4Radiation4% of their works
- 5Organic Chemistry3% of their works
- 6Structural Biology1% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Nanofabrication and Lithography Techniques
- Semiconductor materials and devices
- Optical Coatings and Gratings
- Advanced Electron Microscopy Techniques and Applications
Which keywords describe Chester S. Knurek's research?
The keywords of their largest research topics: High-Resolution Patterning, Nanofabrication, Electron Beam Lithography, Resolution Limits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis and Integrated Circuits.
- Single-Particle Analysis
- Nanostructures
- Soft Lithography
- Material Removal Mechanism
- Chemical Mechanical Planarization
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Resolution Limits
- Nanofabrication
- High-Resolution Patterning
- Electron Beam Lithography
- Scanning Electron Microscopy
- Failure Analysis
- Atomic Layer Deposition
- High-k Dielectrics
- Nanolithography
- Antireflective Coatings
- Cryo-Electron Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- High-Resolution Patterning272 topics
- Nanofabrication262 topics
- Electron Beam Lithography241 topic
- Resolution Limits241 topic
- Scanning Electron Microscopy191 topic
- X-ray Photoelectron Spectroscopy191 topic
- Failure Analysis91 topic
- Integrated Circuits91 topic
- Atomic Layer Deposition31 topic
- Chemical Mechanical Planarization31 topic
- High-k Dielectrics31 topic
- Material Removal Mechanism31 topic
- Nanolithography31 topic
- Soft Lithography31 topic
- Antireflective Coatings21 topic
- Nanostructures21 topic
- Cryo-Electron Microscopy11 topic
- Single-Particle Analysis11 topic
Where does Chester S. Knurek work?
Chester S. Knurek's main affiliation in the publication record is AT&T (United States), United States.
How many publications and citations does Chester S. Knurek have?
OpenAlex counts 25 works and 153 citations for Chester S. Knurek, an h-index of 8, ranking #7,288,876 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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