George E. Bailey
George E. Bailey publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Law, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #5,725,182 of 7,710,434 ranked researchers
- Rank in United States
- #1,421,673 of 1,627,098
- Works
- 31
- Citations
- 165
- Citations per work
- 5.3
What does George E. Bailey research?
George E. Bailey's work is mostly in Engineering (57%), Materials Science (16%), Social Sciences (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2272.3%
- Engineering1856.6%
- Materials Science515.7%
- Everything else620.5%
- Social Sciences27.2%
- Social Sciences27.2%
- 1Electrical and Electronic Engineering39% of their works
- 2Surfaces, Coatings and Films16% of their works
- 3Law7% of their works
- 4Biomedical Engineering6% of their works
- 5Industrial and Manufacturing Engineering6% of their works
- 6Mechanical Engineering6% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Industrial Vision Systems and Defect Detection
- Optical Coatings and Gratings
- Advanced Surface Polishing Techniques
- Advanced optical system design
- Legal principles and applications
Which keywords describe George E. Bailey's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis, Integrated Circuits and Fabric Defect Detection.
- Material Removal Mechanism
- Corrective Justice
- Chemical Mechanical Planarization
- Antireflective Coatings
- Fabric Defect Detection
- Failure Analysis
- Scanning Electron Microscopy
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- X-ray Photoelectron Spectroscopy
- Integrated Circuits
- Machine Vision
- Nanostructures
- Compound Eyes
- Freeform Optics
- Remedies
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Nanofabrication232 topics
- Electron Beam Lithography201 topic
- Resolution Limits201 topic
- Scanning Electron Microscopy101 topic
- X-ray Photoelectron Spectroscopy101 topic
- Failure Analysis91 topic
- Integrated Circuits91 topic
- Fabric Defect Detection41 topic
- Machine Vision41 topic
- Antireflective Coatings31 topic
- Nanostructures31 topic
- Chemical Mechanical Planarization21 topic
- Compound Eyes21 topic
- Corrective Justice21 topic
- Freeform Optics21 topic
- Material Removal Mechanism21 topic
- Remedies21 topic
Where does George E. Bailey work?
George E. Bailey's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does George E. Bailey have?
OpenAlex counts 31 works and 165 citations for George E. Bailey, an h-index of 6, ranking #5,725,182 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
Ask a question or share a note about George E. Bailey. Posts are plain text and can be reported.