H. Brut
H. Brut publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Hardware and Architecture, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #2,801,123 of 7,710,434 ranked researchers
- Rank in France
- #119,050 of 324,115
- Works
- 30
- Citations
- 614
- Citations per work
- 20.5
What does H. Brut research?
H. Brut's work is mostly in Engineering (92%), Computer Science (3%), Physics and Astronomy (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2997.7%
- Engineering2892.1%
- Computer Science13.4%
- Physics and Astronomy12.2%
- Everything else12.3%
- 1Electrical and Electronic Engineering86% of their works
- 2Biomedical Engineering3% of their works
- 3Hardware and Architecture3% of their works
- 4Aerospace Engineering2% of their works
- 5Instrumentation1% of their works
- 6Atomic and Molecular Physics, and Optics1% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- VLSI and Analog Circuit Testing
- Silicon and Solar Cell Technologies
- Low-power high-performance VLSI design
- Ferroelectric and Negative Capacitance Devices
Which keywords describe H. Brut's research?
The keywords of their largest research topics: Process Variation, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Failure Analysis, Integrated Circuits and Reliability.
- Test Data Compression
- Silicon
- Hafnium Oxide
- Embedded Cores
- Reliability
- Failure Analysis
- Nanowire Transistors
- Atomic Layer Deposition
- Process Variation
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Integrated Circuits
- Wide Bandgap Semiconductors
- Ferroelectricity
- Low-Power
- Solar Cells
- VLSI Circuits
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Process Variation252 topics
- Atomic Layer Deposition241 topic
- High-k Dielectrics241 topic
- Nanowire Transistors221 topic
- Tunnel Field-Effect Transistors221 topic
- Failure Analysis71 topic
- Integrated Circuits71 topic
- Reliability51 topic
- Wide Bandgap Semiconductors51 topic
- Embedded Cores31 topic
- Ferroelectricity31 topic
- Hafnium Oxide31 topic
- Low-Power31 topic
- Silicon31 topic
- Solar Cells31 topic
- Test Data Compression31 topic
- VLSI Circuits31 topic
Where does H. Brut work?
H. Brut's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does H. Brut have?
OpenAlex counts 30 works and 614 citations for H. Brut, an h-index of 13, ranking #2,801,123 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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