James W. Liang
James W. Liang publishes mostly in Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Mechanical Engineering, on topics such as Copper Interconnects and Reliability, Semiconductor materials and devices and Electronic Packaging and Soldering Technologies.
- World rank
- #6,478,803 of 7,710,434 ranked researchers
- Rank in Taiwan
- #49,774 of 57,035
- Works
- 18
- Citations
- 48
- Citations per work
- 2.7
What does James W. Liang research?
James W. Liang's work is mostly in Engineering (59%), Materials Science (30%), Biochemistry, Genetics and Molecular Biology (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1688.9%
- Engineering1159.3%
- Materials Science529.6%
- Everything else17.4%
- Life Sciences13.7%
- 1Electrical and Electronic Engineering50% of their works
- 2Electronic, Optical and Magnetic Materials26% of their works
- 3Mechanical Engineering6% of their works
- 4Materials Chemistry4% of their works
- 5Molecular Biology4% of their works
- 6Mechanics of Materials4% of their works
Research topics
- Copper Interconnects and Reliability
- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Metal and Thin Film Mechanics
- Forensic and Genetic Research
- Molecular Biology Techniques and Applications
Which keywords describe James W. Liang's research?
The keywords of their largest research topics: Electromigration, Thin Films, Low-k Dielectrics, Microelectronics, Atomic Layer Deposition, High-k Dielectrics, Interfacial Reactions and Lead-free Solders.
- Real-Time PCR
- Genomic Analysis
- Tunnel Field-Effect Transistors
- Nanoindentation
- Failure Analysis
- Lead-free Solders
- High-k Dielectrics
- Microelectronics
- Thin Films
- Electromigration
- Low-k Dielectrics
- Atomic Layer Deposition
- Interfacial Reactions
- Coatings
- Integrated Circuits
- Nanowire Transistors
- Ancient DNA
- Quantitative
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Electromigration202 topics
- Thin Films162 topics
- Low-k Dielectrics141 topic
- Microelectronics141 topic
- Atomic Layer Deposition131 topic
- High-k Dielectrics131 topic
- Interfacial Reactions61 topic
- Lead-free Solders61 topic
- Coatings21 topic
- Failure Analysis21 topic
- Integrated Circuits21 topic
- Nanoindentation21 topic
- Nanowire Transistors21 topic
- Tunnel Field-Effect Transistors21 topic
- Ancient DNA11 topic
- Genomic Analysis11 topic
- Quantitative11 topic
- Real-Time PCR11 topic
Where does James W. Liang work?
James W. Liang's main affiliation in the publication record is United Microelectronics (Taiwan), Taiwan.
How many publications and citations does James W. Liang have?
OpenAlex counts 18 works and 48 citations for James W. Liang, an h-index of 4, ranking #6,478,803 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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