Jian‐Hsing Lee
Jian‐Hsing Lee publishes mostly in Electrical and Electronic Engineering and Materials Chemistry, on topics such as Electrostatic Discharge in Electronics, Semiconductor materials and devices and Advancements in Semiconductor Devices and Circuit Design.
- World rank
- #1,052,297 of 1,633,909 ranked researchers
- Rank in Taiwan
- #5,689 of 9,848
- Works
- 31
- Citations
- 37
- Citations per work
- 1.2
What does Jian‐Hsing Lee research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering97% of their works
- 2Materials Chemistry3% of their works
Research topics
- Electrostatic Discharge in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electromagnetic Compatibility and Noise Suppression
- Silicon Carbide Semiconductor Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Radio Frequency Integrated Circuit Design
- Electronic Packaging and Soldering Technologies
Which keywords describe Jian‐Hsing Lee's research?
The keywords of their largest research topics: CMOS Technology, ESD Protection, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Electromagnetic Compatibility and EMI.
- Oscillators
- Interfacial Reactions
- Wide Bandgap Semiconductors
- Photon Emission Microscopy
- Integrated Circuits
- Electromagnetic Compatibility
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- ESD Protection
- CMOS Technology
- Atomic Layer Deposition
- Nanowire Transistors
- EMI
- High-Temperature Electronics
- Failure Analysis
- Reliability
- CMOS
- Lead-free Solders
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- CMOS Technology111 topic
- ESD Protection111 topic
- Atomic Layer Deposition61 topic
- High-k Dielectrics61 topic
- Nanowire Transistors61 topic
- Tunnel Field-Effect Transistors61 topic
- EMI51 topic
- Electromagnetic Compatibility51 topic
- High-Temperature Electronics52 topics
- Integrated Circuits52 topics
- Failure Analysis41 topic
- Photon Emission Microscopy41 topic
- Reliability41 topic
- Wide Bandgap Semiconductors41 topic
- CMOS11 topic
- Interfacial Reactions11 topic
- Lead-free Solders11 topic
- Oscillators11 topic
Where does Jian‐Hsing Lee work?
Jian‐Hsing Lee's main affiliation in the publication record is Vanguard International Semiconductor (Taiwan), Taiwan.
How many publications and citations does Jian‐Hsing Lee have?
Science Explorer counts 31 works and 37 citations for Jian‐Hsing Lee, ranking #1,052,297 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.