Julien Ryckaert
Julien Ryckaert publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and 3D IC and TSV technologies.
- World rank
- #1,103,275 of 7,710,434 ranked researchers
- Rank in Belgium
- #10,087 of 67,186
- Works
- 276
- Citations
- 5.9k
- Citations per work
- 21.2
What does Julien Ryckaert research?
Julien Ryckaert's work is mostly in Engineering (80%), Computer Science (9%), Materials Science (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences25793.2%
- Engineering22180.0%
- Computer Science269.4%
- Materials Science62.1%
- Physics and Astronomy51.7%
- Everything else196.8%
- 1Electrical and Electronic Engineering74% of their works
- 2Hardware and Architecture6% of their works
- 3Biomedical Engineering6% of their works
- 4Computer Networks and Communications3% of their works
- 5Materials Chemistry2% of their works
- 6Atomic and Molecular Physics, and Optics2% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
- Low-power high-performance VLSI design
- Integrated Circuits and Semiconductor Failure Analysis
- Radio Frequency Integrated Circuit Design
- Advancements in Photolithography Techniques
- Ferroelectric and Negative Capacitance Devices
Which keywords describe Julien Ryckaert's research?
The keywords of their largest research topics: Process Variation, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Integrated Circuits, Interconnect and Through-Silicon Via.
- Hafnium Oxide
- Oscillators
- Electron Beam Lithography
- Photon Emission Microscopy
- VLSI Circuits
- Through-Silicon Via
- Integrated Circuits
- Nanowire Transistors
- Atomic Layer Deposition
- Process Variation
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Interconnect
- Low-Power
- Failure Analysis
- CMOS
- Nanofabrication
- Ferroelectricity
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Process Variation1482 topics
- Atomic Layer Deposition1151 topic
- High-k Dielectrics1151 topic
- Nanowire Transistors1031 topic
- Tunnel Field-Effect Transistors1031 topic
- Integrated Circuits712 topics
- Interconnect621 topic
- Through-Silicon Via621 topic
- Low-Power451 topic
- VLSI Circuits451 topic
- Failure Analysis401 topic
- Photon Emission Microscopy401 topic
- CMOS311 topic
- Electron Beam Lithography311 topic
- Nanofabrication311 topic
- Oscillators311 topic
- Ferroelectricity271 topic
- Hafnium Oxide271 topic
Where does Julien Ryckaert work?
Julien Ryckaert's main affiliation in the publication record is IMEC, Belgium.
How many publications and citations does Julien Ryckaert have?
OpenAlex counts 276 works and 5,858 citations for Julien Ryckaert, an h-index of 40, ranking #1,103,275 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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