Laurens de Winter
Laurens de Winter publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Mechanical Engineering, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,149,268 of 7,710,434 ranked researchers
- Rank in Netherlands
- #105,162 of 107,149
- Works
- 24
- Citations
- 230
- Citations per work
- 9.6
What does Laurens de Winter research?
Laurens de Winter's work is mostly in Engineering (64%), Materials Science (15%), Physics and Astronomy (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2186.7%
- Engineering1564.3%
- Materials Science414.9%
- Physics and Astronomy27.5%
- Everything else313.3%
- 1Electrical and Electronic Engineering43% of their works
- 2Surfaces, Coatings and Films15% of their works
- 3Mechanical Engineering9% of their works
- 4Biomedical Engineering9% of their works
- 5Radiation8% of their works
- 6Industrial and Manufacturing Engineering3% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced X-ray Imaging Techniques
- Advanced Measurement and Metrology Techniques
- Non-Destructive Testing Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advanced Surface Polishing Techniques
Which keywords describe Laurens de Winter's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis, Integrated Circuits, Phase Retrieval and X-ray Imaging.
- Single-Particle Analysis
- Cryo-Electron Microscopy
- Non-Destructive Evaluation
- Eddy Current Testing
- X-ray Imaging
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Nanofabrication
- Electron Beam Lithography
- Scanning Electron Microscopy
- Failure Analysis
- Phase Retrieval
- Dimensional Metrology
- Error Compensation
- Chemical Mechanical Planarization
- Material Removal Mechanism
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Electron Beam Lithography201 topic
- Nanofabrication201 topic
- Scanning Electron Microscopy81 topic
- X-ray Photoelectron Spectroscopy81 topic
- Failure Analysis71 topic
- Integrated Circuits71 topic
- Phase Retrieval41 topic
- X-ray Imaging41 topic
- Dimensional Metrology31 topic
- Eddy Current Testing31 topic
- Error Compensation31 topic
- Non-Destructive Evaluation31 topic
- Chemical Mechanical Planarization21 topic
- Cryo-Electron Microscopy21 topic
- Material Removal Mechanism21 topic
- Single-Particle Analysis21 topic
Where does Laurens de Winter work?
Laurens de Winter's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Laurens de Winter have?
OpenAlex counts 24 works and 230 citations for Laurens de Winter, an h-index of 10, ranking #7,149,268 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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