M. DeLaus
M. DeLaus publishes mostly in Electrical and Electronic Engineering, Materials Chemistry and Condensed Matter Physics, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Radiation Effects in Electronics.
- World rank
- #2,405,451 of 7,710,434 ranked researchers
- Rank in United States
- #713,209 of 1,627,098
- Works
- 17
- Citations
- 856
- Citations per work
- 50.4
What does M. DeLaus research?
M. DeLaus's work is mostly in Engineering (86%), Materials Science (10%), Physics and Astronomy (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences17100.1%
- Engineering1586.3%
- Materials Science29.8%
- Physics and Astronomy14.0%
- 1Electrical and Electronic Engineering84% of their works
- 2Materials Chemistry8% of their works
- 3Condensed Matter Physics2% of their works
- 4Polymers and Plastics2% of their works
- 5Atomic and Molecular Physics, and Optics2% of their works
- 6Mechanics of Materials2% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Diamond and Carbon-based Materials Research
- Electronic and Structural Properties of Oxides
Which keywords describe M. DeLaus's research?
The keywords of their largest research topics: Nanoelectronics, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Failure Analysis, Integrated Circuits and Radiation Effects.
- Quantum Sensing
- Nanodiamonds
- Interfacial Reactions
- Interconnect
- Radiation Effects
- Failure Analysis
- Nanowire Transistors
- Atomic Layer Deposition
- Nanoelectronics
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Integrated Circuits
- Soft Errors
- Through-Silicon Via
- Lead-free Solders
- Oxide Interfaces
- Two-Dimensional Electron Gases
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Nanoelectronics182 topics
- Atomic Layer Deposition131 topic
- High-k Dielectrics131 topic
- Nanowire Transistors101 topic
- Tunnel Field-Effect Transistors101 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Radiation Effects51 topic
- Soft Errors51 topic
- Interconnect41 topic
- Through-Silicon Via41 topic
- Interfacial Reactions31 topic
- Lead-free Solders31 topic
- Nanodiamonds21 topic
- Oxide Interfaces21 topic
- Quantum Sensing21 topic
- Two-Dimensional Electron Gases21 topic
Where does M. DeLaus work?
M. DeLaus's main affiliation in the publication record is Analog Devices (United States), United States.
How many publications and citations does M. DeLaus have?
OpenAlex counts 17 works and 856 citations for M. DeLaus, an h-index of 9, ranking #2,405,451 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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