M. Zadražil
M. Zadražil publishes mostly in Surfaces, Coatings and Films, Electrical and Electronic Engineering and Biomedical Engineering, on topics such as Electron and X-Ray Spectroscopy Techniques, Advancements in Photolithography Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #4,348,081 of 7,710,434 ranked researchers
- Rank in Czechia
- #13,597 of 39,303
- Works
- 20
- Citations
- 330
- Citations per work
- 16.5
What does M. Zadražil research?
M. Zadražil's work is mostly in Engineering (34%), Materials Science (32%), Physics and Astronomy (11%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1576.9%
- Engineering733.9%
- Materials Science632.2%
- Physics and Astronomy210.8%
- Everything else523.1%
- 1Surfaces, Coatings and Films27% of their works
- 2Electrical and Electronic Engineering25% of their works
- 3Biomedical Engineering9% of their works
- 4Radiation5% of their works
- 5Materials Chemistry5% of their works
- 6Atomic and Molecular Physics, and Optics5% of their works
Research topics
- Electron and X-Ray Spectroscopy Techniques
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Electron Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
- Ion-surface interactions and analysis
- Non-Destructive Testing Techniques
- Surface and Thin Film Phenomena
Which keywords describe M. Zadražil's research?
The keywords of their largest research topics: Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Atom Probe Tomography and Cryo-Electron Microscopy.
- Surface Analysis
- Quantum Size Effects
- Ion Beam
- Three-Dimensional Analysis
- Cryo-Electron Microscopy
- Integrated Circuits
- Nanofabrication
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Electron Beam Lithography
- Failure Analysis
- Atom Probe Tomography
- Single-Particle Analysis
- Eddy Current Testing
- Non-Destructive Evaluation
- Superconductivity
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Scanning Electron Microscopy151 topic
- X-ray Photoelectron Spectroscopy151 topic
- Electron Beam Lithography61 topic
- Nanofabrication61 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Atom Probe Tomography31 topic
- Cryo-Electron Microscopy31 topic
- Single-Particle Analysis31 topic
- Three-Dimensional Analysis31 topic
- Eddy Current Testing21 topic
- Ion Beam21 topic
- Non-Destructive Evaluation21 topic
- Quantum Size Effects21 topic
- Superconductivity21 topic
- Surface Analysis21 topic
Where does M. Zadražil work?
M. Zadražil's main affiliation in the publication record is Tescan (Czechia), Czechia.
How many publications and citations does M. Zadražil have?
OpenAlex counts 20 works and 330 citations for M. Zadražil, an h-index of 7, ranking #4,348,081 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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