Mark P. Baze
Mark P. Baze publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering, on topics such as Radiation Effects in Electronics, Integrated Circuits and Semiconductor Failure Analysis and Semiconductor materials and devices.
- World rank
- #537,320 of 7,710,434 ranked researchers
- Rank in United States
- #186,073 of 1,627,098
- Works
- 33
- Citations
- 1.7k
- Citations per work
- 50.4
What does Mark P. Baze research?
Mark P. Baze's work is mostly in Engineering (87%), Computer Science (12%), Materials Science (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3399.9%
- Engineering2986.8%
- Computer Science412.1%
- Materials Science01.0%
- 1Electrical and Electronic Engineering84% of their works
- 2Hardware and Architecture12% of their works
- 3Biomedical Engineering1% of their works
- 4Ceramics and Composites1% of their works
- 5Aerospace Engineering1% of their works
- 6Computational Mechanics1% of their works
Research topics
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- VLSI and Analog Circuit Testing
- Electrostatic Discharge in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Physical Unclonable Functions (PUFs) and Hardware Security
Which keywords describe Mark P. Baze's research?
The keywords of their largest research topics: Nanoelectronics, CMOS Technology, Radiation Effects, Soft Errors, Failure Analysis, Integrated Circuits, Atomic Layer Deposition and High-k Dielectrics.
- Hardware Trojans
- Tunnel Field-Effect Transistors
- Low-Power
- ESD Protection
- Embedded Cores
- High-k Dielectrics
- Integrated Circuits
- Soft Errors
- CMOS Technology
- Nanoelectronics
- Radiation Effects
- Failure Analysis
- Atomic Layer Deposition
- Process Variation
- Test Data Compression
- SCR Devices
- Nanowire Transistors
- VLSI Circuits
- Physical Unclonable Functions
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Nanoelectronics392 topics
- CMOS Technology353 topics
- Radiation Effects211 topic
- Soft Errors211 topic
- Failure Analysis191 topic
- Integrated Circuits191 topic
- Atomic Layer Deposition181 topic
- High-k Dielectrics181 topic
- Process Variation122 topics
- Embedded Cores91 topic
- Test Data Compression91 topic
- ESD Protection81 topic
- SCR Devices81 topic
- Low-Power61 topic
- Nanowire Transistors61 topic
- Tunnel Field-Effect Transistors61 topic
- VLSI Circuits61 topic
- Hardware Trojans21 topic
- Physical Unclonable Functions21 topic
Where does Mark P. Baze work?
Mark P. Baze's main affiliation in the publication record is Boeing (United States), United States.
How many publications and citations does Mark P. Baze have?
OpenAlex counts 33 works and 1,662 citations for Mark P. Baze, an h-index of 19, ranking #537,320 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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