Norbert Seifert
Norbert Seifert publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Materials Chemistry, on topics such as Radiation Effects in Electronics, VLSI and Analog Circuit Testing and Semiconductor materials and devices.
- World rank
- #481,368 of 7,710,434 ranked researchers
- Rank in United States
- #168,228 of 1,627,098
- Works
- 71
- Citations
- 3.3k
- Citations per work
- 46.8
What does Norbert Seifert research?
Norbert Seifert's work is mostly in Engineering (57%), Computer Science (15%), Materials Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences6185.5%
- Engineering4056.9%
- Computer Science1114.8%
- Materials Science68.1%
- Physics and Astronomy45.7%
- Everything else1014.5%
- 1Electrical and Electronic Engineering46% of their works
- 2Hardware and Architecture15% of their works
- 3Materials Chemistry8% of their works
- 4Computational Mechanics7% of their works
- 5Atomic and Molecular Physics, and Optics6% of their works
- 6Safety, Risk, Reliability and Quality4% of their works
Research topics
- Radiation Effects in Electronics
- VLSI and Analog Circuit Testing
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Ion-surface interactions and analysis
- Reliability and Maintenance Optimization
- Low-power high-performance VLSI design
- Laser-induced spectroscopy and plasma
Which keywords describe Norbert Seifert's research?
The keywords of their largest research topics: Nanoelectronics, CMOS Technology, Radiation Effects, Soft Errors, Embedded Cores, Test Data Compression, Atomic Layer Deposition and High-k Dielectrics.
- Spectroscopy
- VLSI Circuits
- Reliability Engineering
- Surface Analysis
- Integrated Circuits
- High-k Dielectrics
- Test Data Compression
- Soft Errors
- CMOS Technology
- Nanoelectronics
- Radiation Effects
- Embedded Cores
- Atomic Layer Deposition
- Failure Analysis
- Ion Beam
- Maintenance Optimization
- Low-Power
- Material Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Nanoelectronics692 topics
- CMOS Technology502 topics
- Radiation Effects451 topic
- Soft Errors451 topic
- Embedded Cores271 topic
- Test Data Compression271 topic
- Atomic Layer Deposition241 topic
- High-k Dielectrics241 topic
- Failure Analysis141 topic
- Integrated Circuits141 topic
- Ion Beam111 topic
- Surface Analysis111 topic
- Maintenance Optimization81 topic
- Reliability Engineering81 topic
- Low-Power51 topic
- VLSI Circuits51 topic
- Material Analysis41 topic
- Spectroscopy41 topic
Where does Norbert Seifert work?
Norbert Seifert's main affiliation in the publication record is Intel (United States), United States.
How many publications and citations does Norbert Seifert have?
OpenAlex counts 71 works and 3,320 citations for Norbert Seifert, an h-index of 25, ranking #481,368 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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