P. Hrncirik
P. Hrncirik publishes mostly in Structural Biology, Surfaces, Coatings and Films and Materials Chemistry, on topics such as Advanced Electron Microscopy Techniques and Applications, Electron and X-Ray Spectroscopy Techniques and Advanced Materials Characterization Techniques.
- World rank
- #5,892,511 of 7,710,434 ranked researchers
- Rank in United States
- #1,446,553 of 1,627,098
- Works
- 21
- Citations
- 282
- Citations per work
- 13.4
What does P. Hrncirik research?
P. Hrncirik's work is mostly in Materials Science (37%), Biochemistry, Genetics and Molecular Biology (30%), Engineering (15%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1257.7%
- Materials Science837.3%
- Engineering315.3%
- Physics and Astronomy15.1%
- Life Sciences630.5%
- Everything else211.8%
- 1Structural Biology30% of their works
- 2Surfaces, Coatings and Films29% of their works
- 3Materials Chemistry8% of their works
- 4Electrical and Electronic Engineering8% of their works
- 5Biomedical Engineering7% of their works
- 6Radiation5% of their works
Research topics
- Advanced Electron Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Advanced Materials Characterization Techniques
- Advanced X-ray Imaging Techniques
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic and Structural Properties of Oxides
- Advanced Semiconductor Detectors and Materials
Which keywords describe P. Hrncirik's research?
The keywords of their largest research topics: Cryo-Electron Microscopy, Single-Particle Analysis, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Atom Probe Tomography, Three-Dimensional Analysis, Phase Retrieval and X-ray Imaging.
- Semiconductor Materials
- Two-Dimensional Electron Gases
- Nanofabrication
- Failure Analysis
- X-ray Imaging
- Three-Dimensional Analysis
- X-ray Photoelectron Spectroscopy
- Single-Particle Analysis
- Cryo-Electron Microscopy
- Scanning Electron Microscopy
- Atom Probe Tomography
- Phase Retrieval
- Electron Beam Lithography
- Integrated Circuits
- Oxide Interfaces
- Infrared Detectors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Cryo-Electron Microscopy181 topic
- Single-Particle Analysis181 topic
- Scanning Electron Microscopy171 topic
- X-ray Photoelectron Spectroscopy171 topic
- Atom Probe Tomography41 topic
- Three-Dimensional Analysis41 topic
- Phase Retrieval31 topic
- X-ray Imaging31 topic
- Electron Beam Lithography21 topic
- Failure Analysis21 topic
- Integrated Circuits21 topic
- Nanofabrication21 topic
- Oxide Interfaces21 topic
- Two-Dimensional Electron Gases21 topic
- Infrared Detectors11 topic
- Semiconductor Materials11 topic
Where does P. Hrncirik work?
P. Hrncirik's main affiliation in the publication record is Nion (United States), United States.
How many publications and citations does P. Hrncirik have?
OpenAlex counts 21 works and 282 citations for P. Hrncirik, an h-index of 8, ranking #5,892,511 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
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