Roger F. Caldwell
Roger F. Caldwell publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Surface Roughness and Optical Measurements.
- World rank
- #5,929,039 of 7,710,434 ranked researchers
- Rank in United States
- #1,451,716 of 1,627,098
- Works
- 17
- Citations
- 115
- Citations per work
- 6.8
What does Roger F. Caldwell research?
Roger F. Caldwell's work is mostly in Engineering (83%), Materials Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1691.7%
- Engineering1483.5%
- Materials Science18.2%
- Everything else18.3%
- 1Electrical and Electronic Engineering57% of their works
- 2Biomedical Engineering12% of their works
- 3Surfaces, Coatings and Films8% of their works
- 4Industrial and Manufacturing Engineering6% of their works
- 5Computational Mechanics6% of their works
- 6Media Technology2% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Surface Roughness and Optical Measurements
- Industrial Vision Systems and Defect Detection
- Electron and X-Ray Spectroscopy Techniques
- Nanofabrication and Lithography Techniques
- Advanced optical system design
- Silicon and Solar Cell Technologies
Which keywords describe Roger F. Caldwell's research?
The keywords of their largest research topics: High-Resolution Patterning, Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Machine Vision, Fabric Defect Detection and Roughness Measurement.
- Solar Cells
- Silicon
- Freeform Optics
- X-ray Photoelectron Spectroscopy
- Surface Characterization
- Roughness Measurement
- Machine Vision
- Failure Analysis
- Electron Beam Lithography
- High-Resolution Patterning
- Nanofabrication
- Integrated Circuits
- Fabric Defect Detection
- Scanning Electron Microscopy
- Texture Analysis
- Compound Eyes
- Nanolithography
- Soft Lithography
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- High-Resolution Patterning162 topics
- Electron Beam Lithography141 topic
- Nanofabrication141 topic
- Failure Analysis91 topic
- Integrated Circuits91 topic
- Machine Vision62 topics
- Fabric Defect Detection31 topic
- Roughness Measurement31 topic
- Scanning Electron Microscopy31 topic
- Surface Characterization31 topic
- Texture Analysis31 topic
- X-ray Photoelectron Spectroscopy31 topic
- Compound Eyes21 topic
- Freeform Optics21 topic
- Nanolithography21 topic
- Silicon21 topic
- Soft Lithography21 topic
- Solar Cells21 topic
Where does Roger F. Caldwell work?
Roger F. Caldwell's main affiliation in the publication record is Micro Systems Engineering (United States), United States.
How many publications and citations does Roger F. Caldwell have?
OpenAlex counts 17 works and 115 citations for Roger F. Caldwell, an h-index of 6, ranking #5,929,039 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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