Stanislas Baron
Stanislas Baron publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.
- World rank
- #5,862,152 of 7,710,434 ranked researchers
- Rank in France
- #249,234 of 324,115
- Works
- 22
- Citations
- 186
- Citations per work
- 8.5
What does Stanislas Baron research?
Stanislas Baron's work is mostly in Engineering (92%), Computer Science (3%), Materials Science (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2298.5%
- Engineering2092.1%
- Computer Science13.2%
- Materials Science13.2%
- 1Electrical and Electronic Engineering62% of their works
- 2Industrial and Manufacturing Engineering14% of their works
- 3Biomedical Engineering11% of their works
- 4Media Technology5% of their works
- 5Hardware and Architecture3% of their works
- 6Surfaces, Coatings and Films3% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Industrial Vision Systems and Defect Detection
- Advanced Surface Polishing Techniques
- VLSI and FPGA Design Techniques
- Image Processing Techniques and Applications
- VLSI and Analog Circuit Testing
- Electron and X-Ray Spectroscopy Techniques
Which keywords describe Stanislas Baron's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Machine Vision, Failure Analysis, Integrated Circuits, Fabric Defect Detection, Texture Analysis and Chemical Mechanical Planarization.
- Test Data Compression
- Embedded Cores
- Autofocusing
- ASIC
- Chemical Mechanical Planarization
- Fabric Defect Detection
- Failure Analysis
- Nanofabrication
- Electron Beam Lithography
- Machine Vision
- Integrated Circuits
- Texture Analysis
- Material Removal Mechanism
- FPGA
- Depth Estimation
- Scanning Electron Microscopy
- X-ray Photoelectron Spectroscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Electron Beam Lithography211 topic
- Nanofabrication211 topic
- Machine Vision112 topics
- Failure Analysis101 topic
- Integrated Circuits101 topic
- Fabric Defect Detection81 topic
- Texture Analysis81 topic
- Chemical Mechanical Planarization61 topic
- Material Removal Mechanism61 topic
- ASIC51 topic
- FPGA51 topic
- Autofocusing31 topic
- Depth Estimation31 topic
- Embedded Cores21 topic
- Scanning Electron Microscopy21 topic
- Test Data Compression21 topic
- X-ray Photoelectron Spectroscopy21 topic
Where does Stanislas Baron work?
Stanislas Baron's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does Stanislas Baron have?
OpenAlex counts 22 works and 186 citations for Stanislas Baron, an h-index of 9, ranking #5,862,152 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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