Ting-Pu Tai
Ting-Pu Tai publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.
- World rank
- #4,047,028 of 7,710,434 ranked researchers
- Rank in United States
- #1,101,335 of 1,627,098
- Works
- 17
- Citations
- 212
- Citations per work
- 12.5
What does Ting-Pu Tai research?
Ting-Pu Tai's work is mostly in Engineering (66%), Computer Science (34%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences17100.0%
- Engineering1166.0%
- Computer Science634.0%
- 1Electrical and Electronic Engineering54% of their works
- 2Hardware and Architecture34% of their works
- 3Industrial and Manufacturing Engineering12% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Industrial Vision Systems and Defect Detection
- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Physical Unclonable Functions (PUFs) and Hardware Security
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
Which keywords describe Ting-Pu Tai's research?
The keywords of their largest research topics: Embedded Cores, Failure Analysis, Integrated Circuits, Test Data Compression, Fabric Defect Detection, Machine Vision, Atomic Layer Deposition and Electron Beam Lithography.
- Tunnel Field-Effect Transistors
- Nanowire Transistors
- Hardware Trojans
- Nanofabrication
- Electron Beam Lithography
- Machine Vision
- Test Data Compression
- Failure Analysis
- Embedded Cores
- Integrated Circuits
- Fabric Defect Detection
- Atomic Layer Deposition
- High-k Dielectrics
- Process Variation
- Low-Power
- Physical Unclonable Functions
- VLSI Circuits
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Embedded Cores161 topic
- Failure Analysis161 topic
- Integrated Circuits161 topic
- Test Data Compression161 topic
- Fabric Defect Detection61 topic
- Machine Vision61 topic
- Atomic Layer Deposition41 topic
- Electron Beam Lithography41 topic
- High-k Dielectrics41 topic
- Nanofabrication41 topic
- Process Variation22 topics
- Hardware Trojans11 topic
- Low-Power11 topic
- Nanowire Transistors11 topic
- Physical Unclonable Functions11 topic
- Tunnel Field-Effect Transistors11 topic
- VLSI Circuits11 topic
Where does Ting-Pu Tai work?
Ting-Pu Tai's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does Ting-Pu Tai have?
OpenAlex counts 17 works and 212 citations for Ting-Pu Tai, an h-index of 9, ranking #4,047,028 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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