Xiaoqing Wen
Xiaoqing Wen publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Computer Vision and Pattern Recognition, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Radiation Effects in Electronics.
- World rank
- #423,603 of 1,633,909 ranked researchers
- Rank in Japan
- #14,927 of 114,622
- Works
- 88
- Citations
- 188
- Citations per work
- 2.1
What does Xiaoqing Wen research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering54% of their works
- 2Hardware and Architecture30% of their works
- 3Computer Vision and Pattern Recognition3% of their works
- 4Software3% of their works
- 5Biomedical Engineering2% of their works
- 6Industrial and Manufacturing Engineering2% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Physical Unclonable Functions (PUFs) and Hardware Security
- Low-power high-performance VLSI design
- Advancements in Photolithography Techniques
- Software Testing and Debugging Techniques
- Semiconductor materials and devices
Which keywords describe Xiaoqing Wen's research?
The keywords of their largest research topics: Embedded Cores, Failure Analysis, Integrated Circuits, Test Data Compression, CMOS Technology, Nanoelectronics, Radiation Effects and Soft Errors.
- Software Fault Localization
- Automated Testing
- VLSI Circuits
- Nanofabrication
- Hardware Trojans
- Soft Errors
- Nanoelectronics
- Test Data Compression
- Failure Analysis
- Embedded Cores
- Integrated Circuits
- CMOS Technology
- Radiation Effects
- Electron Beam Lithography
- Low-Power
- Physical Unclonable Functions
- Atomic Layer Deposition
- High-k Dielectrics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Embedded Cores261 topic
- Failure Analysis261 topic
- Integrated Circuits261 topic
- Test Data Compression261 topic
- CMOS Technology162 topics
- Nanoelectronics152 topics
- Radiation Effects121 topic
- Soft Errors121 topic
- Electron Beam Lithography41 topic
- Hardware Trojans41 topic
- Low-Power41 topic
- Nanofabrication41 topic
- Physical Unclonable Functions41 topic
- VLSI Circuits41 topic
- Atomic Layer Deposition31 topic
- Automated Testing31 topic
- High-k Dielectrics31 topic
- Software Fault Localization31 topic
Where does Xiaoqing Wen work?
Xiaoqing Wen's main affiliation in the publication record is Kyushu Institute of Technology, Japan.
How many publications and citations does Xiaoqing Wen have?
Science Explorer counts 88 works and 188 citations for Xiaoqing Wen, ranking #423,603 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.