Y. Tosaka
Y. Tosaka publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Nuclear and High Energy Physics, on topics such as Radiation Effects in Electronics, Semiconductor materials and devices and Advancements in Semiconductor Devices and Circuit Design.
- World rank
- #1,194,203 of 7,710,434 ranked researchers
- Rank in Japan
- #17,322 of 383,136
- Works
- 66
- Citations
- 1.7k
- Citations per work
- 25.3
What does Y. Tosaka research?
Y. Tosaka's work is mostly in Engineering (66%), Physics and Astronomy (12%), Computer Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences5785.8%
- Engineering4466.4%
- Physics and Astronomy812.3%
- Computer Science57.1%
- Everything else914.2%
- 1Electrical and Electronic Engineering63% of their works
- 2Hardware and Architecture7% of their works
- 3Nuclear and High Energy Physics5% of their works
- 4Atomic and Molecular Physics, and Optics4% of their works
- 5Radiation4% of their works
- 6Aerospace Engineering4% of their works
Research topics
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Nuclear reactor physics and engineering
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
Which keywords describe Y. Tosaka's research?
The keywords of their largest research topics: Nanoelectronics, CMOS Technology, Radiation Effects, Soft Errors, Process Variation, Atomic Layer Deposition, High-k Dielectrics and Nanowire Transistors.
- Low-Power
- Reliability
- Molten Salt
- Embedded Cores
- Failure Analysis
- Nanowire Transistors
- Atomic Layer Deposition
- Soft Errors
- CMOS Technology
- Nanoelectronics
- Radiation Effects
- Process Variation
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Integrated Circuits
- Test Data Compression
- Nuclear Reactor
- Wide Bandgap Semiconductors
- VLSI Circuits
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 19 words, with their numbers
- Nanoelectronics602 topics
- CMOS Technology412 topics
- Radiation Effects351 topic
- Soft Errors351 topic
- Process Variation282 topics
- Atomic Layer Deposition251 topic
- High-k Dielectrics251 topic
- Nanowire Transistors221 topic
- Tunnel Field-Effect Transistors221 topic
- Failure Analysis181 topic
- Integrated Circuits181 topic
- Embedded Cores141 topic
- Test Data Compression141 topic
- Molten Salt71 topic
- Nuclear Reactor71 topic
- Reliability71 topic
- Wide Bandgap Semiconductors71 topic
- Low-Power61 topic
- VLSI Circuits61 topic
Where does Y. Tosaka work?
Y. Tosaka's main affiliation in the publication record is Fujitsu (Japan), Japan.
How many publications and citations does Y. Tosaka have?
OpenAlex counts 66 works and 1,672 citations for Y. Tosaka, an h-index of 20, ranking #1,194,203 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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