Yeh-Ning Jou
Yeh-Ning Jou publishes mostly in Electrical and Electronic Engineering, Condensed Matter Physics and Materials Chemistry, on topics such as Electrostatic Discharge in Electronics, Silicon Carbide Semiconductor Technologies and Advancements in Semiconductor Devices and Circuit Design.
- World rank
- #7,148,875 of 7,710,434 ranked researchers
- Rank in Taiwan
- #54,256 of 57,035
- Works
- 34
- Citations
- 191
- Citations per work
- 5.6
What does Yeh-Ning Jou research?
Yeh-Ning Jou's work is mostly in Engineering (93%), Physics and Astronomy (4%), Materials Science (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3499.0%
- Engineering3192.6%
- Physics and Astronomy14.3%
- Materials Science12.1%
- 1Electrical and Electronic Engineering90% of their works
- 2Condensed Matter Physics3% of their works
- 3Materials Chemistry2% of their works
- 4Atomic and Molecular Physics, and Optics1% of their works
- 5Control and Systems Engineering1% of their works
- 6Biomedical Engineering1% of their works
Research topics
- Electrostatic Discharge in Electronics
- Silicon Carbide Semiconductor Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
- GaN-based semiconductor devices and materials
- High voltage insulation and dielectric phenomena
Which keywords describe Yeh-Ning Jou's research?
The keywords of their largest research topics: CMOS Technology, ESD Protection, Reliability, Wide Bandgap Semiconductors, Failure Analysis, Integrated Circuits, Nanowire Transistors and Tunnel Field-Effect Transistors.
- Nanocomposites
- Semiconductors
- Electromagnetic Compatibility
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Integrated Circuits
- Wide Bandgap Semiconductors
- ESD Protection
- CMOS Technology
- Reliability
- Failure Analysis
- Nanowire Transistors
- Atomic Layer Deposition
- EMI
- III-Nitrides
- Dielectrics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- CMOS Technology301 topic
- ESD Protection301 topic
- Reliability121 topic
- Wide Bandgap Semiconductors121 topic
- Failure Analysis111 topic
- Integrated Circuits111 topic
- Nanowire Transistors111 topic
- Tunnel Field-Effect Transistors111 topic
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- EMI71 topic
- Electromagnetic Compatibility71 topic
- III-Nitrides31 topic
- Semiconductors31 topic
- Dielectrics21 topic
- Nanocomposites21 topic
Where does Yeh-Ning Jou work?
Yeh-Ning Jou's main affiliation in the publication record is Vanguard International Semiconductor (Taiwan), Taiwan.
How many publications and citations does Yeh-Ning Jou have?
OpenAlex counts 34 works and 191 citations for Yeh-Ning Jou, an h-index of 7, ranking #7,148,875 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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