Bram Kruseman
Bram Kruseman publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Aerospace Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Semiconductor materials and devices.
- World rank
- #2,313,220 of 7,710,434 ranked researchers
- Rank in Netherlands
- #49,413 of 107,149
- Works
- 40
- Citations
- 808
- Citations per work
- 20.2
What does Bram Kruseman research?
Bram Kruseman's work is mostly in Engineering (69%), Computer Science (29%), Environmental Science (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences40100.1%
- Engineering2869.0%
- Computer Science1229.3%
- Environmental Science00.9%
- Materials Science00.9%
- 1Electrical and Electronic Engineering66% of their works
- 2Hardware and Architecture29% of their works
- 3Aerospace Engineering2% of their works
- 4Global and Planetary Change1% of their works
- 5Industrial and Manufacturing Engineering1% of their works
- 6Surfaces, Coatings and Films1% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Advancements in Photolithography Techniques
- VLSI and FPGA Design Techniques
- Electrostatic Discharge in Electronics
Which keywords describe Bram Kruseman's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, Process Variation, Atomic Layer Deposition, High-k Dielectrics and CMOS Technology.
- SCR Devices
- VLSI Circuits
- Low-Power
- Electron Beam Lithography
- Tunnel Field-Effect Transistors
- CMOS Technology
- Atomic Layer Deposition
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Process Variation
- High-k Dielectrics
- Nanowire Transistors
- ASIC
- FPGA
- Nanofabrication
- ESD Protection
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Failure Analysis331 topic
- Integrated Circuits331 topic
- Embedded Cores311 topic
- Test Data Compression311 topic
- Process Variation142 topics
- Atomic Layer Deposition121 topic
- High-k Dielectrics121 topic
- CMOS Technology92 topics
- Nanowire Transistors91 topic
- Tunnel Field-Effect Transistors91 topic
- ASIC51 topic
- Electron Beam Lithography51 topic
- FPGA51 topic
- Low-Power51 topic
- Nanofabrication51 topic
- VLSI Circuits51 topic
- ESD Protection41 topic
- SCR Devices41 topic
Where does Bram Kruseman work?
Bram Kruseman's main affiliation in the publication record is NXP (Netherlands), Netherlands.
How many publications and citations does Bram Kruseman have?
OpenAlex counts 40 works and 808 citations for Bram Kruseman, an h-index of 17, ranking #2,313,220 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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