Bryan M. Tracy
Bryan M. Tracy publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Structural Biology, on topics such as Electron and X-Ray Spectroscopy Techniques, Integrated Circuits and Semiconductor Failure Analysis and Semiconductor materials and devices.
- World rank
- #6,965,096 of 7,710,434 ranked researchers
- Rank in United States
- #1,571,722 of 1,627,098
- Works
- 49
- Citations
- 390
- Citations per work
- 8.0
What does Bryan M. Tracy research?
Bryan M. Tracy's work is mostly in Engineering (50%), Materials Science (20%), Biochemistry, Genetics and Molecular Biology (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3470.2%
- Engineering2550.1%
- Materials Science1020.1%
- Everything else1123.1%
- Life Sciences36.7%
- 1Electrical and Electronic Engineering38% of their works
- 2Surfaces, Coatings and Films15% of their works
- 3Structural Biology7% of their works
- 4Computational Mechanics6% of their works
- 5Biomedical Engineering6% of their works
- 6Electronic, Optical and Magnetic Materials5% of their works
Research topics
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advanced Electron Microscopy Techniques and Applications
- Ion-surface interactions and analysis
- Copper Interconnects and Reliability
- VLSI and Analog Circuit Testing
- Advanced Materials Characterization Techniques
Which keywords describe Bryan M. Tracy's research?
The keywords of their largest research topics: Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis, Integrated Circuits, Atomic Layer Deposition, High-k Dielectrics, Cryo-Electron Microscopy and Single-Particle Analysis.
- Three-Dimensional Analysis
- Embedded Cores
- Surface Analysis
- Low-k Dielectrics
- Single-Particle Analysis
- High-k Dielectrics
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Failure Analysis
- Atomic Layer Deposition
- Cryo-Electron Microscopy
- Ion Beam
- Microelectronics
- Atom Probe Tomography
- Test Data Compression
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Scanning Electron Microscopy201 topic
- X-ray Photoelectron Spectroscopy201 topic
- Failure Analysis181 topic
- Integrated Circuits181 topic
- Atomic Layer Deposition141 topic
- High-k Dielectrics141 topic
- Cryo-Electron Microscopy91 topic
- Single-Particle Analysis91 topic
- Ion Beam71 topic
- Low-k Dielectrics71 topic
- Microelectronics71 topic
- Surface Analysis71 topic
- Atom Probe Tomography41 topic
- Embedded Cores41 topic
- Test Data Compression41 topic
- Three-Dimensional Analysis41 topic
Where does Bryan M. Tracy work?
Bryan M. Tracy's main affiliation in the publication record is Intel (United States), United States.
How many publications and citations does Bryan M. Tracy have?
OpenAlex counts 49 works and 390 citations for Bryan M. Tracy, an h-index of 6, ranking #6,965,096 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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