Edward K. Pavelchek
Edward K. Pavelchek publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Nanofabrication and Lithography Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,217,567 of 7,710,434 ranked researchers
- Rank in United States
- #1,592,835 of 1,627,098
- Works
- 30
- Citations
- 214
- Citations per work
- 7.1
What does Edward K. Pavelchek research?
Edward K. Pavelchek's work is mostly in Engineering (73%), Materials Science (12%), Chemical Engineering (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2687.0%
- Engineering2272.7%
- Materials Science411.9%
- Chemical Engineering12.4%
- Everything else413.0%
- 1Electrical and Electronic Engineering52% of their works
- 2Biomedical Engineering16% of their works
- 3Surfaces, Coatings and Films8% of their works
- 4Computational Mechanics5% of their works
- 5Electronic, Optical and Magnetic Materials4% of their works
- 6Bioengineering2% of their works
Research topics
- Advancements in Photolithography Techniques
- Nanofabrication and Lithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- 3D IC and TSV technologies
- Electron and X-Ray Spectroscopy Techniques
- Surface Roughness and Optical Measurements
- Thin-Film Transistor Technologies
- Copper Interconnects and Reliability
Which keywords describe Edward K. Pavelchek's research?
The keywords of their largest research topics: High-Resolution Patterning, Electron Beam Lithography, Nanofabrication, Nanolithography, Soft Lithography, Failure Analysis, Integrated Circuits and Interconnect.
- Surface Characterization
- Plasmonics
- Low-k Dielectrics
- Through-Silicon Via
- Interconnect
- Failure Analysis
- Nanolithography
- Electron Beam Lithography
- High-Resolution Patterning
- Nanofabrication
- Soft Lithography
- Integrated Circuits
- Scanning Electron Microscopy
- X-ray Photoelectron Spectroscopy
- Microelectronics
- Roughness Measurement
- Thin-Film Transistors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- High-Resolution Patterning312 topics
- Electron Beam Lithography231 topic
- Nanofabrication231 topic
- Nanolithography81 topic
- Soft Lithography81 topic
- Failure Analysis41 topic
- Integrated Circuits41 topic
- Interconnect41 topic
- Scanning Electron Microscopy41 topic
- Through-Silicon Via41 topic
- X-ray Photoelectron Spectroscopy41 topic
- Low-k Dielectrics31 topic
- Microelectronics31 topic
- Plasmonics31 topic
- Roughness Measurement31 topic
- Surface Characterization31 topic
- Thin-Film Transistors31 topic
Where does Edward K. Pavelchek work?
Edward K. Pavelchek's main affiliation in the publication record is MCNC Research and Development Institute, United States.
How many publications and citations does Edward K. Pavelchek have?
OpenAlex counts 30 works and 214 citations for Edward K. Pavelchek, an h-index of 7, ranking #7,217,567 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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