James Word
James Word publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #7,566,158 of 7,710,434 ranked researchers
- Rank in United States
- #1,617,216 of 1,627,098
- Works
- 76
- Citations
- 468
- Citations per work
- 6.2
What does James Word research?
James Word's work is mostly in Engineering (78%), Materials Science (10%), Computer Science (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences7092.2%
- Engineering6078.5%
- Materials Science79.6%
- Computer Science34.1%
- Everything else67.8%
- 1Electrical and Electronic Engineering56% of their works
- 2Biomedical Engineering11% of their works
- 3Surfaces, Coatings and Films10% of their works
- 4Industrial and Manufacturing Engineering8% of their works
- 5Hardware and Architecture4% of their works
- 6Mechanical Engineering4% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Industrial Vision Systems and Defect Detection
- Advanced Surface Polishing Techniques
- VLSI and Analog Circuit Testing
- Semiconductor Lasers and Optical Devices
- Nanofabrication and Lithography Techniques
Which keywords describe James Word's research?
The keywords of their largest research topics: High-Resolution Patterning, Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy and Fabric Defect Detection.
- Nanolithography
- Optical Interconnects
- Embedded Cores
- Chemical Mechanical Planarization
- Fabric Defect Detection
- Scanning Electron Microscopy
- Failure Analysis
- Electron Beam Lithography
- High-Resolution Patterning
- Nanofabrication
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Machine Vision
- Material Removal Mechanism
- Test Data Compression
- Semiconductor Lasers
- Soft Lithography
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- High-Resolution Patterning642 topics
- Electron Beam Lithography581 topic
- Nanofabrication581 topic
- Failure Analysis261 topic
- Integrated Circuits261 topic
- Scanning Electron Microscopy191 topic
- X-ray Photoelectron Spectroscopy191 topic
- Fabric Defect Detection161 topic
- Machine Vision161 topic
- Chemical Mechanical Planarization121 topic
- Material Removal Mechanism121 topic
- Embedded Cores81 topic
- Test Data Compression81 topic
- Optical Interconnects71 topic
- Semiconductor Lasers71 topic
- Nanolithography61 topic
- Soft Lithography61 topic
Where does James Word work?
James Word's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does James Word have?
OpenAlex counts 76 works and 468 citations for James Word, an h-index of 12, ranking #7,566,158 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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