Liyang Lai
Liyang Lai publishes mostly in Hardware and Architecture, Electrical and Electronic Engineering and Software, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Software Testing and Debugging Techniques.
- World rank
- #4,960,240 of 7,710,434 ranked researchers
- Rank in United States
- #1,290,092 of 1,627,098
- Works
- 25
- Citations
- 225
- Citations per work
- 9.0
What does Liyang Lai research?
Liyang Lai's work is mostly in Computer Science (54%), Engineering (43%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2497.3%
- Computer Science1454.2%
- Engineering1143.1%
- Everything else12.7%
- 1Hardware and Architecture42% of their works
- 2Electrical and Electronic Engineering38% of their works
- 3Software10% of their works
- 4Industrial and Manufacturing Engineering3% of their works
- 5Computer Networks and Communications3% of their works
- 6Control and Systems Engineering3% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Software Testing and Debugging Techniques
- Advancements in Photolithography Techniques
- Physical Unclonable Functions (PUFs) and Hardware Security
- Parallel Computing and Optimization Techniques
- Electrostatic Discharge in Electronics
- Industrial Vision Systems and Defect Detection
Which keywords describe Liyang Lai's research?
The keywords of their largest research topics: Embedded Cores, Test Data Compression, Failure Analysis, Integrated Circuits, Automated Testing, Software Fault Localization, Electron Beam Lithography and Nanofabrication.
- Machine Vision
- ESD Protection
- Performance Optimization
- Physical Unclonable Functions
- Nanofabrication
- Software Fault Localization
- Integrated Circuits
- Test Data Compression
- Embedded Cores
- Failure Analysis
- Automated Testing
- Electron Beam Lithography
- Hardware Trojans
- Parallel Computing
- CMOS Technology
- Fabric Defect Detection
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Embedded Cores221 topic
- Test Data Compression221 topic
- Failure Analysis181 topic
- Integrated Circuits181 topic
- Automated Testing71 topic
- Software Fault Localization71 topic
- Electron Beam Lithography61 topic
- Nanofabrication61 topic
- Hardware Trojans41 topic
- Physical Unclonable Functions41 topic
- Parallel Computing31 topic
- Performance Optimization31 topic
- CMOS Technology21 topic
- ESD Protection21 topic
- Fabric Defect Detection21 topic
- Machine Vision21 topic
Where does Liyang Lai work?
Liyang Lai's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does Liyang Lai have?
OpenAlex counts 25 works and 225 citations for Liyang Lai, an h-index of 9, ranking #4,960,240 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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