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Researcher · Mentor Technologies · United States

Pat J. LaCour

Pat J. LaCour publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.

OpenAlex
World rank
#7,440,774
of 7,710,434 ranked researchers
Rank in United States
#1,609,049
of 1,627,098
Works
33
Citations
102
Citations per work
3.1
h-index
6
i10-index 2Top 82% in Electrical and Electronic Engineering
Pat J. LaCour

What does Pat J. LaCour research?

Pat J. LaCour's work is mostly in Engineering (79%), Materials Science (7%), Computer Science (4%).

Physical Sciences: 30 works · 89.8% of their workEngineering: 26 works · 78.6% of their workElectrical and Electronic Engineering: 17 works · 51.0% of their workIndustrial and Manufacturing Engineering: 5 works · 14.3% of their workBiomedical Engineering: 3 works · 8.2% of their workMechanical Engineering: 2 works · 5.1% of their workMaterials Science: 2 works · 7.1% of their workSurfaces, Coatings and Films: 2 works · 7.1% of their workComputer Science: 1 works · 4.1% of their workHardware and Architecture: 1 works · 4.1% of their workEverything else: 3 works · 10.2% of their workTHEIR WORKPat J. LaCour33works
Physical Sciences90%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering2678.6%
    2. Materials Science27.1%
    3. Computer Science14.1%
  2. Everything else310.2%
  1. 1Electrical and Electronic Engineering51% of their works
  2. 2Industrial and Manufacturing Engineering14% of their works
  3. 3Biomedical Engineering8% of their works
  4. 4Surfaces, Coatings and Films7% of their works
  5. 5Mechanical Engineering5% of their works
  6. 6Hardware and Architecture4% of their works

Research topics

Which keywords describe Pat J. LaCour's research?

The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Fabric Defect Detection, Machine Vision, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 16 words, with their numbers
  1. Electron Beam Lithography281 topic
  2. Nanofabrication281 topic
  3. Failure Analysis121 topic
  4. Integrated Circuits121 topic
  5. Fabric Defect Detection91 topic
  6. Machine Vision91 topic
  7. Scanning Electron Microscopy71 topic
  8. X-ray Photoelectron Spectroscopy71 topic
  9. Chemical Mechanical Planarization61 topic
  10. Material Removal Mechanism61 topic
  11. Assembly Planning51 topic
  12. Design for Manufacture51 topic
  13. Embedded Cores41 topic
  14. Test Data Compression41 topic
  15. ASIC31 topic
  16. FPGA31 topic

Where does Pat J. LaCour work?

Pat J. LaCour's main affiliation in the publication record is Mentor Technologies, United States.

How many publications and citations does Pat J. LaCour have?

OpenAlex counts 33 works and 102 citations for Pat J. LaCour, an h-index of 6, ranking #7,440,774 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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