S. Haendler
S. Haendler publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Hardware and Architecture, on topics such as Advancements in Semiconductor Devices and Circuit Design, Semiconductor materials and devices and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #2,796,695 of 7,710,434 ranked researchers
- Rank in France
- #118,870 of 324,115
- Works
- 121
- Citations
- 2.2k
- Citations per work
- 18.0
What does S. Haendler research?
S. Haendler's work is mostly in Engineering (94%), Computer Science (2%), Physics and Astronomy (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences11998.3%
- Engineering11493.9%
- Computer Science21.9%
- Physics and Astronomy21.7%
- Materials Science10.8%
- Everything else21.7%
- 1Electrical and Electronic Engineering92% of their works
- 2Biomedical Engineering2% of their works
- 3Hardware and Architecture2% of their works
- 4Atomic and Molecular Physics, and Optics1% of their works
- 5Materials Chemistry1% of their works
- 6Condensed Matter Physics0% of their works
Research topics
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Radio Frequency Integrated Circuit Design
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
- Ferroelectric and Negative Capacitance Devices
Which keywords describe S. Haendler's research?
The keywords of their largest research topics: Process Variation, Nanowire Transistors, Tunnel Field-Effect Transistors, Atomic Layer Deposition, High-k Dielectrics, Integrated Circuits, Failure Analysis and Photon Emission Microscopy.
- Hafnium Oxide
- ESD Protection
- Reliability
- CMOS
- Low-Power
- Photon Emission Microscopy
- Integrated Circuits
- Atomic Layer Deposition
- Nanowire Transistors
- Process Variation
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- Failure Analysis
- CMOS Technology
- VLSI Circuits
- Oscillators
- Wide Bandgap Semiconductors
- Ferroelectricity
- SCR Devices
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 19 words, with their numbers
- Process Variation1282 topics
- Nanowire Transistors1071 topic
- Tunnel Field-Effect Transistors1071 topic
- Atomic Layer Deposition941 topic
- High-k Dielectrics941 topic
- Integrated Circuits552 topics
- Failure Analysis381 topic
- Photon Emission Microscopy381 topic
- CMOS Technology292 topics
- Low-Power211 topic
- VLSI Circuits211 topic
- CMOS171 topic
- Oscillators171 topic
- Reliability161 topic
- Wide Bandgap Semiconductors161 topic
- ESD Protection81 topic
- Ferroelectricity81 topic
- Hafnium Oxide81 topic
- SCR Devices81 topic
Where does S. Haendler work?
S. Haendler's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does S. Haendler have?
OpenAlex counts 121 works and 2,175 citations for S. Haendler, an h-index of 21, ranking #2,796,695 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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