Thomas L. Laidig
Thomas L. Laidig publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #7,367,086 of 7,710,434 ranked researchers
- Rank in United States
- #1,603,906 of 1,627,098
- Works
- 42
- Citations
- 232
- Citations per work
- 5.5
What does Thomas L. Laidig research?
Thomas L. Laidig's work is mostly in Engineering (80%), Materials Science (13%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3992.7%
- Engineering3479.8%
- Materials Science512.9%
- Everything else37.3%
- 1Electrical and Electronic Engineering60% of their works
- 2Surfaces, Coatings and Films13% of their works
- 3Biomedical Engineering9% of their works
- 4Industrial and Manufacturing Engineering6% of their works
- 5Media Technology2% of their works
- 6Computational Mechanics2% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Nanofabrication and Lithography Techniques
- Industrial Vision Systems and Defect Detection
- 3D IC and TSV technologies
- Optical Coatings and Gratings
- Advanced optical system design
Which keywords describe Thomas L. Laidig's research?
The keywords of their largest research topics: High-Resolution Patterning, Nanofabrication, Electron Beam Lithography, Resolution Limits, Failure Analysis, Integrated Circuits, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.
- Freeform Optics
- Through-Silicon Via
- Interconnect
- Soft Lithography
- Machine Vision
- X-ray Photoelectron Spectroscopy
- Integrated Circuits
- Resolution Limits
- Nanofabrication
- High-Resolution Patterning
- Electron Beam Lithography
- Failure Analysis
- Scanning Electron Microscopy
- Fabric Defect Detection
- Nanolithography
- Antireflective Coatings
- Nanostructures
- Compound Eyes
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- High-Resolution Patterning462 topics
- Nanofabrication452 topics
- Electron Beam Lithography401 topic
- Resolution Limits401 topic
- Failure Analysis241 topic
- Integrated Circuits241 topic
- Scanning Electron Microscopy111 topic
- X-ray Photoelectron Spectroscopy111 topic
- Fabric Defect Detection61 topic
- Machine Vision61 topic
- Nanolithography61 topic
- Soft Lithography61 topic
- Antireflective Coatings51 topic
- Interconnect51 topic
- Nanostructures51 topic
- Through-Silicon Via51 topic
- Compound Eyes31 topic
- Freeform Optics31 topic
Where does Thomas L. Laidig work?
Thomas L. Laidig's main affiliation in the publication record is Micro Systems Engineering (United States), United States.
How many publications and citations does Thomas L. Laidig have?
OpenAlex counts 42 works and 232 citations for Thomas L. Laidig, an h-index of 10, ranking #7,367,086 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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